An ion trap system

An ion trap and ion technology, applied in the field of ion trap systems, can solve the problems of beam and ion dislocation, change of beam transmission direction, affecting the fidelity of quantum state manipulation, etc.

Active Publication Date: 2021-08-13
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the prior art, the beam emitted from the laser needs to be transmitted over a long distance to the ions, and the beam is easily affected by the external environment, which in turn causes the transmission direction of the beam to change, etc., and because the beam is focused on the ion The beam waist is small, which makes it easier for the beam transmitted to the ion to be misaligned with the ion, or even misaligned between the beam and the ion, which will affect the fidelity of quantum state manipulation

Method used

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Examples

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example 1

[0147] Figure 4A Another ion trap system architecture provided in the present application. like Figure 4A As shown, the ion trap system includes a laser regulating module 11, an ion prisoner module 12, a feedback module 131, and a control module 132. The laser regulating module 11 includes a first beam member 111a, a lens 112a, n first MEMS mirror 113a, a m second MEMS mirror 114a and an objective lens 115a, n first beam and N first MEMS mirror 113a One correspondence, the M second beam corresponds to one one one one by one, i.e., a first MEMS mirror 113a, can change a first beam with the transmission direction, and a second MEMS mirror 114a can change. A second beam transport direction.

[0148] The first beam unit 111a is used to divide the beam from the laser into N first beams and M second beams. In a possible implementation, the first beam unit 111a can also be used to divide the beam from the laser into P first beam and the second beam, where N first beam belongs to P first...

example 2

[0187] like Figure 4B Shown, a schematic view of still another ion trap of the present application provides a system configuration. The ion trap includes a laser-control system module 11, the ion trapping module 12, the feedback module 131 and control module 132. Regulatory module 11 includes a first laser beam splitter 111a, a lens 112a, N of first micro-electromechanical system MEMS mirror 113a, M second MEMS mirror 114a, 115a and the objective lens AOM116a, the control module 132 includes an RF source 1321. AOM116a comprising N first channels and M second channels (e.g. Figure 4B FIG filled with different patterns identified), N first channels correspond to the N first beam, M second channels correspond to M second light beam, and the first channel and the N-th M there is no overlap between the two channels, the first channel and the N second channels and M are independently regulated.

[0188] AOM116a, for the first beam splitter through the lenses 111a and 112a of the N first...

example 3

[0205] like Figure 4D As shown, it is a schematic diagram of still another ion trap system for the present application. The ion trap system can be in the above Figure 4B The first switch 1322a and the second switch 1323a are added to the control module 132 in the ion trap system shown. The first switch 1322a is configured to control the N first passages of the AOM116A, and the second switch 1323a is used to control the M second channels of the AOM 116A, and the n first channels and M second channels can be independently regulated separately. The first switch 1322a is configured to control the state of the first switch according to the seventh control signal of the control module 132, and the seventh control signal is determined by the timing dimension according to the timing of the quantum state control of the N ion 121. The appearance is constantly switching. The second switch 1323a is configured to control the second switch to keep the open state according to the eighth control ...

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Abstract

An ion trap system, including a laser control module for dividing the light beam into P first light beams and Q second light beams, N first light beams in the P first light beams are respectively transmitted to N ions, and the Q first light beams are respectively transmitted to N ions. The M second light beams in the two light beams are respectively transmitted to M monitoring units; the M monitoring units are used to monitor the M second light beams respectively, and obtain the spatial intensity distribution information of the M second light beams respectively, and the feedback control module is used for Receive the spatial intensity distribution information of the M second light beams, determine N first control signals according to the spatial intensity distribution information of the M second light beams, and transmit the N first control signals to the laser control module, wherein the N first control signals A control signal is in one-to-one correspondence with the N first beams, and the first control signal is used to control the laser control module to align the corresponding first beams with the ions. In this way, it is helpful to improve the alignment of the first light beam and the corresponding ions, thereby improving the fidelity of quantum state manipulation of the ions.

Description

Technical field [0001] The present application relates to the field of quantum techniques, and more particularly to a ion trap system. Background technique [0002] With the development of information technology, quantum state control is increasingly concerned, especially quantum calculations in quantum control. The basic principle of quantum calculation is to encode information using quantum bits (such as ions), where a single quantum bit is not only 0 and 1 or two classic states, but also a superimposed state of 0 and 1, n quantum bit can At the same time n The superimposed state of the quantum state. Currently, quantum calculations are constantly trying to algorithm software and hardware systems. [0003] In the hardware system of quantum calculations, currently the mainstream can be used for ion traps and superconducting systems. For example, 5 quantum bits fully programmable ion trap system, 20 quantum bit online superconducting quantum calculation cloud service. The ion tra...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J3/00
CPCH01J3/00G02B26/0833G02F1/11G06N10/40G21K1/003G02F1/29
Inventor 沈杨超李政宇苏长征
Owner HUAWEI TECH CO LTD
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