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Ion trap system

An ion trap and ion technology, applied in the field of ion trap systems, can solve problems such as misalignment of beams and ions, changes in beam transmission directions, and inability to align beams with ions

Active Publication Date: 2020-07-07
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the prior art, the beam emitted from the laser needs to be transmitted over a long distance to the ions, and the beam is easily affected by the external environment, which in turn causes the transmission direction of the beam to change, etc., and because the beam is focused on the ion The beam waist is small, which makes it easier for the beam transmitted to the ion to be misaligned with the ion, or even misaligned between the beam and the ion, which will affect the fidelity of quantum state manipulation

Method used

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Examples

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example 1

[0147] Figure 4a It is a schematic diagram of another ion trap system architecture provided in this application. Such as Figure 4a As shown, the ion trap system includes a laser regulation module 11 , an ion trapping module 12 , a feedback module 131 and a control module 132 . The laser control module 11 includes a first beam splitter 111a, a lens 112a, N first MEMS mirrors 113a, M second MEMS mirrors 114a and an objective lens 115a, N first light beams and N first MEMS mirrors 113a One-to-one correspondence, M second beams correspond to M second MEMS mirrors 114a one-to-one, that is, a first MEMS mirror 113a can change the transmission direction of a first beam and a second MEMS mirror 114a can change A direction of propagation of the second light beam.

[0148] The first beam splitter 111a is used for splitting the beam from the laser into N first beams and M second beams. In a possible implementation manner, the first beam splitter 111a can also be used to divide the ...

example 2

[0187] Such as Figure 4b As shown, it is a schematic structural diagram of another ion trap system provided by the present application. The ion trap system includes a laser regulation module 11 , an ion trapping module 12 , a feedback module 131 and a control module 132 . The laser control module 11 includes a first beam splitter 111a, a lens 112a, N first MEMS mirrors 113a, M second MEMS mirrors 114a, an objective lens 115a and an AOM 116a, and the control module 132 includes an RF source 1321. AOM116a includes N first channels and M second channels (such as Figure 4b shown with filling marks of different patterns), N first channels are in one-to-one correspondence with N first beams, M second channels are in one-to-one correspondence with M second beams, and N first channels and M first beams are in one-to-one correspondence There is no overlap between the two channels, and the N first channels and the M second channels are independently regulated.

[0188] AOM116a, for...

example 3

[0205] Such as Figure 4d As shown, it is a schematic diagram of another ion trap system architecture provided by the present application. The ion trap system can be used in the above Figure 4b A first switch 1322a and a second switch 1323a are added to the control module 132 in the ion trap system shown. The first switch 1322a is used to control the N first channels of the AOM 116a, the second switch 1323a is used to control the M second channels of the AOM 116a, and the N first channels and the M second channels can be controlled independently. The first switch 1322a is used to control the state of the first switch according to the seventh control signal of the control module 132. The seventh control signal is determined by the control module 132 according to the timing of the manipulation of the quantum states of the N ions 121, in the time dimension The above performance is constantly switching. The second switch 1323a is used to control the second switch to remain ope...

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Abstract

An ion trap system comprises: a laser regulation and control module used for dividing a light beam into P first light beams and Q second light beams, wherein N first light beams in the P first light beams are transmitted to N ions respectively, and M second light beams in the Q second light beams are transmitted to M monitoring units respectively; the M monitoring units are used for respectively monitoring M second light beams, and thereby spatial intensity distribution information of the M second light beams is obtained; the feedback control module is used for receiving spatial intensity distribution information of the M second light beams; n first control signals are determined according to the spatial intensity distribution information of the M second light beams and transmitted to a laser regulation and control module, the N first control signals correspond to the N first light beams in a one-to-one mode, and the first control signals are used for controlling the laser regulation and control module to align the corresponding first light beams with ions. In this way, the alignment degree of the first light beam and the corresponding ion can be improved, and therefore the fidelity of quantum state control over the ion is improved.

Description

technical field [0001] The present application relates to the field of quantum technology, in particular to an ion trap system. Background technique [0002] With the development of information technology, quantum state manipulation has attracted more and more attention, especially quantum computing in quantum state manipulation. The basic principle of quantum computing is to use qubits (such as ions) to encode information. The state of a single qubit not only has two classical states of 0 and 1, but also a superposition state of 0 and 1. n qubits can At the same time in 2 n A superposition of quantum states. At present, quantum computing has been continuously tried in terms of algorithm software and hardware systems. [0003] In terms of hardware systems for quantum computing, the current mainstream feasible solutions are ion traps and superconducting systems. For example, a 5-qubit fully programmable ion trap system, and a 20-qubit online superconducting quantum comput...

Claims

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Application Information

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IPC IPC(8): H01J3/00
CPCH01J3/00G02B26/0833G02F1/11G06N10/40G21K1/003G02F1/29
Inventor 沈杨超李政宇苏长征
Owner HUAWEI TECH CO LTD
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