Preparation and characterization method of precious metal ultrafine wire EBSD test sample
A technology for testing samples and ultra-fine wires, which is used in measurement devices, analysis materials, material analysis using wave/particle radiation, etc. Identification and thickness measurement of grain boundary distribution, etc., to achieve the effect of improving spatial resolution and comprehensive analysis range, comprehensive data support, and improving accuracy
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Embodiment 1
[0034] Embodiment 1: a kind of precious metal superfine wire material EBSD test sample preparation and characterization method, concrete steps are as follows:
[0035] (1) Stretch and bond the noble metal Ag ultrafine wire sample with a diameter of 10 μm on the top of the inclined surface of the double-tilt sample stage, where the inclination of the double-tilt sample stage is 36°, and the two ends of the noble metal Ag ultrafine wire sample are tightened And parallel to the intersection line of the two slopes of the double-tilt sample stage; then placed in the sample chamber, sealed the sample chamber and evacuated, used the secondary electron microscope of the double-beam scanning electron microscope to observe the position of the precious metal Ag ultra-fine wire sample, and adjusted the noble metal Ag ultra-fine wire sample position. The position of the thin wire sample in the field of view, select the section preparation and test area of the precious metal Ag ultra-fine ...
Embodiment 2
[0038] Embodiment 2: a kind of precious metal ultrafine wire EBSD test sample preparation and characterization method, the specific steps are as follows:
[0039] (1) Ultra-fine wire samples of precious metals (four alloys with different compositions, namely Ag, AgAuPd, Au and Au / Ag) with a diameter of 20 μm were stretched and bonded to the top of the inclined surface of the double-tilt sample stage, and the double-tilt sample The inclination of the stage is 36°, and the two ends of the precious metal ultrafine wire sample are tightened and parallel to the intersection line of the two inclined planes of the double-tilt sample stage; then placed in the sample chamber, the sample chamber is sealed and vacuumized, and the two Sub-electron microscope to observe the position of the precious metal ultra-fine wire sample, adjust the position of the precious metal ultra-fine wire sample in the field of view, and select the section preparation and testing area of the precious metal ul...
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