Board-mode program-controlled voltage bias test circuit of large-scale digital integrated circuit

Abstract

The invention relates to a board-mode program-controlled voltage bias test circuit of a large-scale digital integrated circuit. The program-controlled voltage bias test circuit comprises a power supply module, a first numerical control potentiometer, a second numerical control potentiometer, a first relay, a second relay, a third relay, a first resistor, a second resistor, a third resistor and aninstruction control module, wherein a first control end of the power supply module is connected with an adjustable resistor end of the first numerical control potentiometer, a second control end of the power supply module is connected with an output end of the first relay, a first input end of the first relay is connected with an adjustable resistor end of the second numerical control potentiometer, and a first input end of the first relay is connected with an output end of the second relay. According to the invention, through cooperation of the power supply module, the numerical control potentiometer, the relay, the resistor and the instruction control module, automatic control of bias voltage in a large-scale digital circuit board mode bias test is realized, a large-size special instrument does not need to be carried, and thus the portability is better.

Description

technical field [0001] The invention relates to a board mode program-controlled voltage bias test circuit of a large-scale digital integrated circuit, which belongs to the field of integrated circuit tests. Background technique [0002] When performing reliability tests such as board-level electrical performance testing, verification, and burn-in of large-scale digital integrated circuits, it is often necessary to conduct voltage bias tests on the core, IO, PLL, and other dedicated power supply ports of the circuit. The bias voltage is generally in the manual About ±10% of the rated value. In the actual test, there are mainly three ways to supply power to the circuit: (1) through a special program-controlled power supply instrument; (2) through a power module with fixed voltage output, such as DC / DC, LDO, etc.; (3) through a power supply with variable voltage output module. The above methods have the following problems in actual use: [0003] (1) The main problem of using...

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Problems solved by technology

[0003] (1) The main problem of using a special program-controlled power supply instrument is that the volume and weight of the instrument are generally large, and it is not easy to carry during the test, especially when the operating voltage of the integrated circuit is more than 4 circuits (such as Xilinx 7 series FPGA , need VCCINT, VCCAUX, VCCAUX_IO, VCCO of different banks, VCCBRAM, VREF, MGTAVCC, MGTAVTT, MGTVCCAUX, VCCADC, and other auxiliary circuits on the board to supply power, etc.), will need to use multiple program-controlled power meters, which is more difficult to carry

[0004] (2) The main problem of power supply through the power module with fixed voltage output is that the pull-bias voltage of the integrated circuit is generally about ±10% of the standard value, such as 3.0V and 3.6V after 3.3V pull-bias, and 1.0V pull-bias The last is 0.9V and 1.1V, and the power module with fixed voltage output can only provide standard voltage output such as 1.0V, 1.8V, 2.5V, 3.3V, etc., so it cannot be used for pull-bias test

Regardless of whether it is re-installing a new resistance resistor or using an adjustable potentiometer, manual operation cannot be avoided, and automated testing cannot be realized.

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