A method for precise location of failure points in gil withstand voltage test
A technology of precise positioning and withstand voltage testing, which is applied in the direction of using optical methods for testing, testing dielectric strength, environmental/reliability testing, etc., can solve problems such as labor-intensive, inconvenient, and primitive methods, and reduce serious damage , good analysis, and the effect of overcoming defects
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[0023] In order to make the purpose, technical solution and advantages of the present invention more clear and definite, the content of the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, only parts related to the present invention are shown in the drawings but not all content.
[0024] The embodiment of the present invention discloses a method for accurately locating the fault point of the GIL withstand voltage test, using four detection systems, namely an ultra-high frequency online monitoring system, a GIL turning section PD detection system, an SF6 spectrum detection system, and an ultrasonic monitoring system. It solves the problem of labor-intensive and inconven...
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