Two-stage error correction coding method and system applied to storage system in satellite severe environment

Abstract

The invention provides a two-stage error correction coding method and system applied to a storage system in an on-satellite severe environment. The method and the system mainly aim at solving the problem that when the storage system is attacked by high-energy particles in a space irradiation environment, a plurality of single event upset errors occur in a storage unit. The method comprises the following steps: 1, selecting an intra-word and inter-word coding scheme according to the characteristics of an on-board memory; 2, performing intra-character coding on each character; 3, after intra-word codes are generated, performing inter-word coding; 4, performing intra-word error detection in the decoding operation to obtain a corresponding syndrome; and judging whether the code word has an error or not according to the obtained syndrome, and if so, carrying out an error correction process; 5, in the error correction process, firstly performing intra-word restoration, and if the restorationcannot be passed, entering an inter-word error correction stage; and 6, an inter-character error correction stage: reading other characters in the same group of stripes, performing error detection, error correction and intra-character recovery, and if the other characters in the same group can be correctly recovered, performing inter-character verification to recover error stripes.

Description

technical field [0001] The invention belongs to the technical field of on-board reliable storage systems in harsh space environments, and in particular relates to a two-level redundant coding scheme and system based on combined coding. Background technique [0002] In the harsh space environment (such as the earth's radiation belt, and the corresponding cosmic rays), there are a large number of high-energy particles. When these charged particles pass through the microelectronic devices in the aerospace system, electron-hole pairs may be generated in the sensitive area inside the device. After these charges are collected by the electrodes of the sensitive device, it will cause abnormal changes in the logic state of the device or damage the device. Since this effect is the result of the action of a single particle, it is called a single event effect or a single event. [0003] Single event effects are divided into single event flipping, single event blocking, single event bur...

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Problems solved by technology

[0006] The present invention aims at the phenomenon that multiple single-particle flips occur when the on-board storage system is attacked by high-energy particles as the on-orbit spaceflight operation environment becomes more and more complex, causing There are multiple bit errors in the word, but the conventional Hamming error-correcting code is difficult to guarantee the reliability of the on-orbit system. A two-level redundant coding scheme and system based on combined coding is proposed.

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