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Method for improving FSS laser etching machining precision on surface of antenna reflector

An antenna reflector and laser etching technology, which is applied in laser welding equipment, metal processing equipment, manufacturing tools, etc., can solve the problems of laser etching precision reduction, and achieve the effect of improving testing efficiency and processing accuracy

Active Publication Date: 2019-09-20
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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  • Abstract
  • Description
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AI Technical Summary

Problems solved by technology

[0004] Aiming at the problem that the error between the actual profile and the designed profile of the antenna reflector leads to a decrease in the accuracy of laser etching, the present invention provides a method for improving the processing accuracy of FSS laser etching on the surface of the antenna reflector. The data is converted into the same coordinate system as the design surface data for comparative analysis, and the design surface data for laser etching is corrected according to the error, thereby improving the accuracy of subsequent laser etching processing

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] A metal aluminum film with a thickness of about 1.5 μm was prepared on the surface of the antenna reflector (projection diameter Φ400 mm, eccentricity about 1.45) by arc ion coating method, and the antenna was measured using a three-coordinate measurement system CNC670 (uniaxial test accuracy 23 μm) The reflector housing is subjected to non-contact measurement to obtain the actual profile data; among them, the specific steps of testing the actual profile data are as follows:

[0023] First determine the coordinates of the center point of the antenna reflector profile through the eight mutually symmetrical reference holes on the skirt of the antenna reflector and set it as the origin of the Cartesian coordinate system; since the capture range of the TTL coaxial laser system is 500 μm, set the adjacent The interval step of the measurement point is 3mm~4mm (to ensure that automatic focus can be achieved during point-by-point measurement during the measurement process of the...

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Abstract

The invention relates to a method for improving FSS laser etching machining precision on the surface of an antenna reflector, and belongs to the technical field of antenna reflector FSS machining. According to the method, design profile data for laser etching are corrected by using actually-measured profile data of the antenna reflector for the first time, namely, the actually-measured profile data are converted into the same coordinate system as the design profile data for comparison analysis, the design profile data for laser etching are corrected according to errors, so that the subsequent antenna surface FSS laser etching processing precision is improved. The dimension precision and relative position precision of an antenna reflector surface FSS oscillator graph manufactured through the method are both superior to 15 microns.

Description

technical field [0001] The invention relates to a method for improving the laser etching processing precision of an antenna reflector surface FSS (frequency selective surface), and belongs to the technical field of antenna reflector FSS processing. Background technique [0002] Frequency Selective Surface (FSS) refers to the distribution of periodic gaps on the surface of conductive metal or the arrangement of periodic metal patches on the medium to achieve the purpose of frequency selection, that is, a spatial filter. Three-dimensional curved surface laser etching technology is currently the most advantageous and potential frequency selective surface manufacturing method in the manufacture of antenna reflector FSS. [0003] Satellite antenna shells are usually made of composite materials with small mass, high specific strength, good chemical stability, fatigue resistance, and impact resistance. At present, most of the composite material antenna shells are processed by one-...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B23K26/362B23K26/70
CPCB23K26/362B23K26/705
Inventor 王瑞尚凯文周晖吴敢杨建平郑军左华平
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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