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Mineral identification method based on reflection spectrum

A reflection spectrum and identification method technology, applied in color/spectral characteristic measurement, material analysis through optical means, measurement device, etc., can solve the problems of long identification time and low identification accuracy of mineral components, and achieve short identification time, Solve the problem of low recognition accuracy and high accuracy

Inactive Publication Date: 2019-07-02
中国黄金集团石湖矿业有限公司
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Problems solved by technology

[0004] The invention proposes a mineral identification method based on reflection spectrum, which solves the problems of low identification accuracy and long identification time of mineral components in the prior art

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  • Mineral identification method based on reflection spectrum
  • Mineral identification method based on reflection spectrum
  • Mineral identification method based on reflection spectrum

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Embodiment Construction

[0063] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0064] Such as Figure 1 to Figure 6 Shown, the mineral identification method based on reflection spectrum that the present invention proposes, comprises the following steps:

[0065] S1. For data measurement, rinse the collected samples with clean water, remove surface dust with a soft brush, and dry in the shade for 72 to 80 hours in a ventilated place;

[0066] Then turn on the spectrometer, install the high-density probe, and preheat for 30 to 45 minutes, then...

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Abstract

The invention, which belongs to the technical field of mineral identification, proposes a mineral identification method based on reflection spectrum. The method comprises the following steps: S1, carrying out data measurement; to be specific, measuring a plurality of sampling points in a sample by using a spectrograph to obtain a measurement value; S2, carrying out data processing; to be specific,acquiring a spectral waveform of each sampling point based on the measurement value of each sampling point in the S1, carrying out splicing correction, and then carrying out equalization to obtain aspectral waveform of the sample; S3, carrying out mineral identification; to be specific, carrying out calculation on the spectral waveform data of the sample in the S2 to obtain the position of a characteristic valley, carrying out standard matching on typical minerals in a spectrum database based on the wavelength of the characteristic valley to obtain a matched mineral, and then comparing the spectral waveform of the matched mineral with the spectral waveform of the sample to obtain minerals that may exist in the sample; and S4, carrying out data calculation; to be specific, carrying out fitting calculation on the minerals that may exist in the sample to obtain mineral compositions in the sample and relative content of all compositions. Therefore, problems of low recognition precision and long recognition time in the prior art are solved.

Description

technical field [0001] The invention belongs to the technical field of mineral identification and relates to a mineral identification method based on reflection spectrum. Background technique [0002] At present, the popular research methods for the alteration of surrounding rocks of ore deposits are: (1) Visual observation + identification under a microscope, but this method is difficult for fine-grained and particulate altered minerals such as kaolin, illite, sericite, etc. Accurate and effective identification; (2) Using X-ray diffraction and electron microprobes to analyze the samples to be detected, although accurate, the sample processing is complicated and expensive. [0003] Compared with the above methods, the reflection spectrum identification method developed rapidly in recent years has the characteristics of fast, effective, low cost and convenient on-site observation, and has been rapidly developed and applied. However, when it is used, there will be discontinu...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/31
CPCG01N21/3103
Inventor 田超张友刚赵卫忠吴亚峰牛战恩
Owner 中国黄金集团石湖矿业有限公司
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