On-chip detection system and test method for identifying aged and recycled integrated circuit

Abstract

The invention discloses an on-chip detection system and a test method for identifying aged and recycled integrated circuit. The system comprises a test data register, a peripheral circuit, a delay calibration module, a clock path, and a critical path. The method comprises: step 1, configuring the test data register; step 2, calibrating a calibration path in the delay calibration module; step 3, outputting a calibration result as a test data vector; step 4, solving an aging time according to a theoretical model; and step 5, performing an off-chip test flow. The advantages of the present invention are that: the area and the power consumption cost are small; the system can be easily deployed on a large-scale integrated circuit and used as an on-chip test structure; the error for identifying the aging time that the aged and recycled integrated circuit experienced is small and no more than 30 days; the test precision of the delay calibration module is very high and can reach 15 ps; and theworking performance of the chip in the current aging state can be detected.

Description

technical field [0001] The invention relates to an on-chip detection system and test method for identifying aging and recycled integrated circuits, especially an on-chip detection system and test method that can identify aging or recycled integrated circuits by means of path delay calibration. Design For Test (Design For Test) field. Background technique [0002] In recent years, more and more counterfeit integrated circuits (Counterfeit Integrated Circuit) have flowed into the supply chain of electronic components. This not only brings economic losses to integrated circuit design and manufacturers, but also brings major security threats and hidden dangers to users. Counterfeiting integrated circuits has become a common concern of the government and the entire electronic information industry. More than 80% of the counterfeit integrated circuits are aging recycled integrated circuits, and aging recycled integrated circuits are bound to be affected by aging effects such as n...

AI Technical Summary

Problems solved by technology

[0004] ① The area and power consumption are too large;

[0005] ② The detection or recognition accuracy is not high enough;

[0006] ③The cost of user use and testing is high;

[0007] ④Unable to detect the current performance status of the chip

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