Organic transistor with transverse high-order structure
An organic transistor and transistor technology, applied in semiconductor devices, electric solid devices, semiconductor/solid device manufacturing, etc., can solve the problems of short channel length, channel width or density cannot be further increased, and organic materials cannot be used to achieve high The effects of high current density, good chemical and thermal stability, and good photoelectric properties
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Embodiment 1
[0024] An organic transistor with a lateral high-order structure, the composition of which includes: Si / SiO 2 A substrate (1), the substrate is connected to the source Au / Cr film layer (2), and the source is connected to the insulating layer Al 2 o 3 The thin film layer (3), the active layer PbPc thin film layer (4) is connected to the substrate, and the drain Au thin film layer (5) is connected to the active layer PbPc thin film layer.
[0025] The described organic transistor with a lateral high-order structure is characterized in that: the SiO 2 The thickness is 200nm, the thickness of the source electrode Au / Cr film layer is 30nm, the insulating layer Al 2 o 3 The thickness of the active layer PbPc film is 60nm, the thickness of the active layer PbPc film is 420 nm, the thickness of the drain Au film is 75nm, the attached figure 1 is a device structure with a thickness of each layer.
Embodiment 2
[0027] A method for fabricating an organic transistor with a lateral high-order structure. The fabrication method adopts a polystyrene (PS) sphere masking method, spreading polystyrene (PS) spheres on a substrate, and after the particles are spread, sequentially spread them on the sample Deposition of Cr, Au and Al 2 o 3 , deposited Cr / Au / Al 2 o 3 After that, particles are selectively removed, PbPc is deposited by evaporation, and finally, gold electrodes are deposited.
[0028] The method for manufacturing an organic transistor with a lateral high-order structure is characterized in that: the substrate is Si / SiO 2 , the thickness of silica was 200 nm, the substrate was cleaned by ultrasonic agitation in acetone, and exposed to UV / O at 150 °C 3 For 30 min, the PS spheres were spread on the substrate using the dipping method, and the substrate was immersed in the PS sphere solution dispersed with ultrapure water for 3 h, the excess PS particles were rinsed off in ultrapu...
Embodiment 3
[0031] A kind of organic transistor with lateral high-order structure described in embodiment 1 or 2, Si / SiO2 substrate, Au / Cr film layer as source electrode, Si substrate as gate, Al 2 o 3The thin film layer is used as an insulating layer, the Au thin film layer is used as a drain electrode, and the PbPc / Au is used as a high-order structure to form a vertical stacked structure.
[0032] The source and drain are arranged vertically through organic semiconductors, and all transistors are connected in parallel, effectively increasing the current density.
[0033] attached figure 2 It is a characteristic test circuit diagram of an organic transistor with a lateral high-order structure.
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