Quality and voltage withstanding test device for high-energy-storage-density capacitor

Abstract

The invention discloses a quality and voltage withstanding test device for a high-energy-storage-density capacitor. The test device is composed of a charging power source, a discharge circuit, a signal processing unit, a control system and a computer. The input terminal of the charging power source is connected to commercial power and the output terminal is connected in series with a current-limiting resistor and a discharging loop to form a main test loop; a test capacitor, a discharge switch, a modulated inductor, a modulated resistor are connected in series successively to form the discharge circuit; and the charging power source, the current-limiting resistor, the discharge circuit, the signal processing unit, and the control system are connected successively to form a closed-loop feedback system. According to the quality and voltage withstanding test device with the perfect functions, quality testing and voltage withstanding testing of capacitors with different capacitance valuescan be carried out under conditions of different voltages, frequencies, and discharge currents.

Description

technical field [0001] The invention relates to the field of energy storage capacitors, in particular to a high energy storage density capacitor quality and withstand voltage test device. Background technique [0002] Capacitors with high energy storage density are the most widely used energy storage components in pulse power technology, and have a wide range of applications in electric power industry, national defense industry and other high-tech fields. Under normal conditions, the main method of quality test assessment is to conduct test assessments of different voltages and pulse current levels according to the technical requirements of various energy storage capacitors. The number of tests for each batch should be about tens of thousands of times. The withstand voltage test is of great significance to the development of energy storage capacitors with high performance, high repetition frequency and long life. There is no unified standard for testing the quality characte...

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Problems solved by technology

[0003] The purpose of the present invention is to provide a high energy storage density capacitor quality and withstand voltage test device, to solve the problem that the prior art cannot systematically provide the relationship between its quality and withstand voltage characteristics and various test parameters, which will cause problems in a certain To a certain extent, it restricts researchers to more scientifically evaluate the life characteristics of high energy storage density capacitors, and also restricts the improvement and improvement of product performance.

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