Polarization state parameter measuring device and method based on transmission point diffraction type common digital holography

Abstract

The invention relates to a polarization state parameter measuring device and method based on transmission point diffraction type common digital holography. The method comprises the following steps: enabling 45-degree polarized beams to pass through a to-be-measured object, a first lens, a first non-polarization splitting prism, a hole array, a second lens and a second non-polarization splitting prism so as to form two beams of light, respectively irradiating a first plane mirror and a second plane mirror, and reflecting the light to the second non-polarization splitting prism; converging by the second non-polarization splitting prism, enabling the light to sequentially pass through the second lens, the hole array, the first non-polarization splitting prism, a third lens and a polarizationsplitting prism, and forming two carrier-frequency holograms containing polarization horizontal component and vertical component information respectively; and collecting the holograms to a computer byan image sensor, and calculating to obtain Stokes matrix parameters and Jones matrix parameters. The measuring device is simple and compact in structure, excellent in stability and high in light energy utilization rate; and moreover, adjustment is convenient, no optical grating, reflection pinhole, or optical corner reflector or any special optical component is needed, and the cost is low.

Description

technical field [0001] The invention belongs to the field of polarization state parameter measurement, in particular to a polarization state parameter measurement device and method based on transmission point diffraction co-channel digital holography. Background technique [0002] Polarization state is one of the important parameters to describe the wavefront characteristics of light waves. It can be characterized by Stokes matrix parameters and Jones matrix parameters. Its measurement has important scientific significance and significance in the fields of biophotonics, nonlinear optics, chemistry and mineralogy Value. However, the traditional polarization state measurement device can only provide polarization information at a fixed position in the propagation direction of the wavefront to be measured, and because it does not have two-dimensional sampling characteristics, frequent adjustment of the optical path and multiple exposures are required to achieve the measurement o...

AI Technical Summary

Problems solved by technology

However, this method requires two-dimensional grating and hole array matching, supplemented by two polarizers with orthogonal polarization, which is not only complex in structure, but also difficult to adjust

[0005] Patent CN 104198040 B "A Holographic Measurement Method and Implementing Device for Two-dimensional Jones Matrix Parameters" utilizes dual two-dimensional grating spectroscopic technology combined with spectrum multiplexing technology to realize Jones matrix parameter measurement through one exposure, but the device not only further increases The complexity of the system is increased, and the light utilization rate is high. At the same time, due to the use of a separate optical path structure, the anti-interference ability is poor

Yuan Caojin from Nanjing Normal University et al. (Ma Jun, Yuan Caojin, Feng Shaotong, Nie Shouping, "Full Field Polarization Measurement Method Based on Digital Holography and Multiplexing Technology", Acta Phys. 22, 224204 (2013)) used polarization and Angle division multiplexing technology can realize Stokes matrix parameter and Jones vector measurement through one exposure, but because of the use of a separate optical path structure, the anti-interference ability is poor; at the same time, due to the structural limitation, the polarization orthogonal spectrum is limited in the spectrum space, and then Cause crosstalk and affect the measurement accuracy of polarization state parameters

Images