System and method for detecting surface defect of solar cell panel

A solar panel and defect detection technology, applied in the field of image processing, can solve the problems of not being able to adapt to the defect requirements of the production process, the difficulty of achieving consistent detection standards, and the difficulty of improving the efficiency of manual detection, etc., to achieve strong anti-interference ability and fast speed on site , The effect of improving the operation speed

Inactive Publication Date: 2017-08-04
HANGZHOU DIANZI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the above two detection methods have their own limitations: manual observation requires a lot of labor and the accuracy is not high. At present, there are some defects in the production process that are difficult to detect with the naked eye. With the increase of production, the efficiency of manual detection is difficult to improve and It is difficult to achieve consistent detection standards for everyone; infrared image detection is greatly affected by the surrounding environment
Therefore, the traditional solar surface defect detection method is increasingly unable to adapt to the increasingly complex production process and higher defect requirements.
Therefore, in order to overcome the limitations of traditional detection methods, it is necessary to study new detection methods and equipment for surface defects of solar cells.

Method used

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  • System and method for detecting surface defect of solar cell panel

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Embodiment 1

[0031] see figure 1 , is a schematic structural diagram of a solar panel surface defect detection system according to Embodiment 1 of the present invention, a solar panel surface defect detection system, including an image acquisition module 10, an image processing module 20 and an interactive terminal 30, wherein,

[0032] The image acquisition module 10 outputs the captured solar panel image to the image processing module 20 for image processing and solar panel surface defect analysis, and the output of the image processing module 20 is connected to the interactive terminal 30, The interactive terminal 30 receives the instruction and responds in real time and displays the type and location of the surface defect of the solar cell panel.

[0033] Through the solar panel surface defect detection system set up above, the front-end is composed of an image acquisition module 10 , a back-end image processing module 20 and an interactive terminal 30 . The front-end image acquisitio...

Embodiment 2

[0035] see figure 2 , which is a schematic structural diagram of a solar cell panel surface defect detection system according to an embodiment of the present invention.

[0036] The image acquisition module 10 includes a camera 110 and an LED light source group 120 , and the LED light source group 120 supplements light when the camera 110 collects images.

[0037] The above-mentioned camera 110 adopts a CCD type and is responsible for capturing raw image data and outputting analog video signals to the rear end. In this embodiment, a 5-megapixel industrial camera of the VCXG-53M model of the German Baumer Company is selected. The camera uses a GigE power supply: an external 12-24V or PoE (Power over Ethernet). The specific embodiment can also include XW0816 high-definition industrial lens. XW0816 is a 5-megapixel high-definition precision industrial lens that supports 8-16mm zoom. It is a high-resolution lens specially used in machine vision, medical imaging, biological detec...

Embodiment 3

[0039] see image 3 , which is a schematic structural diagram of a solar cell panel surface defect detection system according to an embodiment of the present invention.

[0040] The image processing module 20 includes a preprocessing unit 210, an image segmentation unit 220, and a pattern recognition unit 230. The three are connected in sequence to identify defects on the surface of the solar panel, and process and evaluate the type, size, color and depth of the defects. The pattern recognition unit 230 at least includes a color difference recognition subunit, a dirt recognition subunit and a defect recognition subunit.

[0041] The preprocessing unit 210 at least completes the median filtering and edge detection subunits, wherein,

[0042] Median filtering: Perform two-dimensional median filtering on the image. Its function is to remove noise and protect the edge of the image, which also belongs to image enhancement. The two-dimensional median filter can be expressed by th...

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Abstract

The invention discloses a system and a method for detecting the surface defect of a solar cell panel. The system comprises an image acquisition module, an image processing module and an interaction terminal, wherein the image acquisition module outputs the captured image of the solar panel to the image processing module and carries out image processing and solar cell panel surface defect flaw analysis, the output of the image processing module is connected with the interaction terminal, and the interaction terminal receives an instruction, and responses and displays the type and the position of the surface defect of the solar cell panel in real time. The detection system and the detection method, which are provided by the invention, have the advantages of detection of the surface defect of the solar cell panel, evaluation of flaw points, and analysis of the type, the size, the color and the depth of the flaws.

Description

technical field [0001] The invention belongs to the field of image processing, and in particular relates to a detection system and method for surface defects of solar panels. Background technique [0002] Nowadays, with the depletion of non-renewable energy pollution and other issues, environmental protection issues have attracted more and more attention, and the development of renewable energy is already a future trend. It is estimated that by 2030, renewable energy will account for more than 30% of the global energy mix. As an important part of renewable energy, solar cells are expected to usher in rapid development. With the continuous development of technology, various solar panel manufacturers reduce the thickness of silicon wafers to reduce costs. At present, the thickness of silicon wafers is generally on the order of 100 microns. This method is easy to cause defects such as cracks and missing corners in the product. The pass rate of products is one of the key fact...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
Inventor 曹恒华盛庆华李竹毛礼建蔡强
Owner HANGZHOU DIANZI UNIV
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