Structure detection confocal microscopy imaging method and apparatus based on spatial light modulator

Abstract

The invention provides a structure detection confocal microscopy imaging method and apparatus based on a spatial light modulator, and mainly solves problems of low image acquisition rate and long image processing time of conventional confocal microscopy imaging. According to the method, a structure detection method is introduced to a confocal scanning microscopic system, a structure detection function is simulated by employing the spatial light modulator, detection light spots are modulated, the light intensity after modulation is measured by employing a photoelectric detector, a light intensity value corresponding to a sampling point of a to-be-measured sample is obtained, and three-dimensional imaging of the to-be-measured sample can be realized with the combination of a scanning mechanism of the confocal microscopy system. The invention also provides a measuring device applicable to the method, structure detection is realized through the transmission type spatial light modulator and the photoelectric detector, the resolution is high, and the imaging speed is high.

Description

technical field [0001] The invention belongs to the field of confocal microscopic imaging, and in particular relates to a method and a device for realizing structure detection super-resolution imaging in a confocal microscopic system by using a spatial light modulator. Background technique [0002] Optical microscopy is a long-established and important non-destructive technique widely used in fields such as biology and materials science. Confocal microscopic measurement technology is a three-dimensional optical microscopy technology suitable for micron and submicron scale measurement. The tomographic capabilities of reflective confocal microscopy systems make them important in the field of 3D imaging. [0003] In the mid-to-late 1950s, the confocal microscope was invented by Minsky. In 1977, C.J.R. Sheppard and A.Choudhury first clarified that the confocal microscope system under the action of the dot pinhole mask, at the expense of the field of view, the lateral resolution...

AI Technical Summary

Problems solved by technology

[0007] The deficiencies of the existing structure detection technology described in the above-mentioned documents and their references are: the CCD is affected by the exposure speed, and the image acquisition rate is low; the subsequent image processing, that is, the virtual structure detection modulation takes a long time

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