General bias circuit board for aerospace semiconductor device total dose radiation test

Abstract

The invention discloses a general bias circuit board for aerospace semiconductor device total dose radiation test. The general bias circuit board comprises a motherboard, multiple general daughter boards independent of one another, and multiple test device fixtures. The general daughter boards are used for configuring voltages and bias loads for different irradiated devices, and are vertically inserted onto the back of the motherboard. The test device fixtures are used for inserting the irradiated devices, and are arranged on the front of the motherboard in a centralized way. For devices which are packaged in the same way and different in pin definition and power-on bias, total dose radiation test can be completed using the same motherboard by configuring different general daughter boards. For devices which are packaged in different ways and are the same in pin definition and power-on bias, total dose radiation test can be completed using the same motherboard by welding different test device fixtures. The space of the motherboard occupied by resistive and capacitive components is reduced, and the effective radiation area is increased effectively. Moreover, the general bias circuit board has the advantages of easy fabrication, low cost, high efficiency, reusability and high universality, and has popularization and application values.

Description

technical field [0001] The invention relates to a circuit board used for a total dose radiation test, in particular to a general bias circuit board used for a total dose radiation test of aerospace components, belonging to the field of total dose radiation tests of aerospace semiconductor devices. Background technique [0002] In the current space environment, there is a total dose radiation effect, and in order for the spacecraft to work normally in the complex space environment, it is necessary to strengthen the design of the spacecraft against the radiation effect. In the process of reinforcement design, it is necessary to give the anti-radiation ability index of semiconductor devices, so it is first necessary to evaluate the anti-radiation ability of semiconductor devices for aerospace, and to carry out ground total dose simulation experiments for aerospace components to obtain the anti-radiation ability of semiconductor devices for aerospace. Total dose irradiation capa...

AI Technical Summary

Problems solved by technology

[0004] However, most of the bias circuit boards used in the total dose test at home and abroad are individually designed test circuit boards according to the static bias power-on state of different devices. Different devices have different pin definitions and different power-on conditions. state, so that the irradiation bias circuit boards of different devices cannot be used with each other, and one bias circuit board can only be used for the total dose test of one device, resulting in low utilization rate of the bias circuit board and high test cost; In addition, each device must be independently designed and manufactured with a bias circuit board, resulting in a long test cycle for the total dose, which seriously restricts the evaluation speed of the device's radiation resistance. For the rapidly developing aerospace industry, this situation needs to be improved urgently

In addition, besides the devices and fixtures that need to be irradiated, there are also some resistors and capacitors required by the bias circuit on the bias circuit board produced at home and abroad. These resistance-capacitance components occupy a lot of space on the bias circuit board. , so that the effective radiation area of ​​the circuit board is not large, and due to the limitation of the uniformity of the radiation field of the cobalt source, the irradiation area with the same dose rate is limited. All test devices above, these are very unfavorable under the current machine-time conditions with limited radiation sources

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