Processing method of conductive plasticine used for fixing SEM (Scanning Electron Microscope) sample

Abstract

The invention discloses a processing method of conductive plasticine used for fixing an SEM sample. The method comprises the following steps that metallographic plasticine is heated, placed on a smooth glass plane and evened out into a slice, non-pasted non-gel long single carbon fibers are sprinkled on the slice, the single carbon fibers are overlapped with one another to form an interlaced 2D structure, a roller presses the carbon fibers into the plasticine lightly, it is ensured that the surface of the plasticine is adhered with the overlapped single carbon fibers uniformly, and the plasticine whose surface is adhered with the overlapped single carbon fibers uniformly is rolled into a cylindrical shape and then evened out into a slice along the vertical direction. The carbon fibers are added in a layered manner for multiple times and then extruded in an anisotropic manner, a 3D conductive structure communicated with each other is formed among the long single carbon fibers added to the metallographic plasticine, cumulative charges are eliminated effectively, and the conductive plasticine can fix an irregular piece or an inclined side of the sample effectively, and is suitable for use of the SEM.

Description

technical field [0001] The invention belongs to the technical field of experimental equipment, in particular to a processing method of conductive plasticine used for fixing scanning electron microscope samples. Background technique [0002] Scanning Electron Microscope (SEM) is a means of observing microscopic properties between the transmission electron microscope and the optical microscope. It can directly use the material properties of the sample surface material for microscopic imaging. The advantages of the scanning electron microscope are: (1) high magnification; (2) large depth of field, large field of view, and three-dimensional imaging, which can directly observe the fine structure of the uneven surface of various samples. Scanning electron microscopy (SEM) mainly uses secondary electron signal imaging to observe the surface morphology of samples. When the sample resistance is large, under the continuous scanning of the electron beam, the surface of the sample grad...

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Problems solved by technology

Metallographic plasticine can fix special-shaped parts very well, which is convenient for metallographic observation, but it is not conductive; invention patent: a method of enhancing the conductivity of plasticine for children's toys (publication number 105268198A) is to add plasticine to plasticine Conductive powder, and SEM analysis needs to be carried out under high vacuum. The conductive powder in the plasticine may fall off and contaminate the microscope lens; Invention patent: vertical hanging demonstration teaching aid for circuit teaching based on plasticine as a wire (public number 105931542A) The conductive plasticine used is to add salt water to the plasticine. The same SEM analysis requires a dry and clean environment to avoid volatilization, so the above two conductive plasticines are not suitable.

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