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Preparation method of GaN substrate

A technology of substrates and composite substrates, which is applied in the manufacture of semiconductor/solid-state devices, semiconductor devices, electrical components, etc., can solve the problems of low crystal quality and yield of GaN substrate materials, complicated processes, etc., and achieve the convenience of large-scale batch production The production and preparation methods are simple and the price is low

Active Publication Date: 2017-01-04
PEKING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to reduce the stress accumulation in heteroepitaxy, technologies such as insertion layer and lateral epitaxy are applied to the crystal growth process. Because these two technologies have high requirements on the process, the process is relatively complicated, and they are easily affected by the process and make GaN The crystal quality of the substrate material suffers and the yield is not high

Method used

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  • Preparation method of GaN substrate

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Effect test

Embodiment 1

[0029] Embodiment 1. Preparation of c-plane self-supporting GaN substrate:

[0030] 1) The substrate can be a sapphire substrate, or a thin film of GaN, AlN, InN or other III-nitride materials grown on a sapphire substrate; the carbon nanotubes are arranged in parallel along the growth plane, and the arrangement is It can be an isoperiodic or periodic disordered structure. Carbon nanotubes can be a single carbon nanotube or a cluster of carbon nanotubes, arranged in various forms such as single layer or multilayer. The range of carbon nanotube laying Beyond the edge of the substrate: the present embodiment selects the sapphire substrate of the c plane, and selects the three-layer carbon nanotubes arranged vertically along the substrate reference edge with equal periods; the diameter of the carbon nanotubes is 1-100 nanometers, and the present embodiment adopts 20 Nanometer; the period is 1-100 microns, preferably 1-10 microns, and 2 microns are used in this embodiment; the car...

Embodiment 2

[0037] Embodiment 2. Preparation of c-plane GaN composite substrate:

[0038] 1) The substrate can be a sapphire substrate, or a thin film of GaN, AlN, InN or other III-nitride materials grown on a sapphire substrate; the carbon nanotubes are arranged in parallel along the growth plane, and the arrangement is It can be an isoperiodic or periodic disordered structure. Carbon nanotubes can be a single carbon nanotube or a cluster of carbon nanotubes, arranged in various forms such as single layer or multilayer. The range of carbon nanotube laying Beyond the edge of the substrate: the present embodiment selects the sapphire substrate of the c plane, and selects three-layer carbon nanotubes arranged in the vertical direction along the reference side of the substrate at equal periods; the diameter of the carbon nanotubes is 1-100 nanometers, and the present embodiment adopts 20 Nanometer; the period is 1-100 microns, preferably 1-10 microns, and 2 microns are used in this embodimen...

Embodiment 3

[0045] Embodiment 3. Preparation of non-polar a-plane self-supporting GaN or thick film composite substrate:

[0046] 1) The substrate can be an r-plane sapphire substrate, or a thin film of GaN, AlN, InN or other group III nitride materials grown on a sapphire substrate; the carbon nanotubes are arranged in parallel along the growth plane. The way can be isoperiodic, or periodic disordered structure, carbon nanotubes can be a single carbon nanotube, can also be a variety of forms such as a cluster of carbon nanotubes, carbon nanotubes laying range beyond the edge of the substrate: this implementation For example, the r-plane sapphire substrate is selected, and the research shows that a-plane GaN is obtained by epitaxy on the r-plane sapphire. Three-layer carbon nanotubes arranged in the vertical direction along the reference side of the substrate are selected for use; the diameter of the carbon nanotubes is 1-100 nanometers, and 20 nanometers are used in this embodiment; the ...

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Abstract

The invention discloses a preparation method of a GaN substrate, wherein the preparation method belongs to the field of optoelectronic device preparation. According to the preparation method, a GaN film, an InGaN film, an AlGaN film, an AlN film or an InN film or nanometer columns are epitaxially grown on a sapphire substrate on which carbon nanotubes are laid for forming a transition layer; a carbon nanotube laying range exceeds the edge of the substrate by 200 mu m-1 mm; then a composite substrate is arranged below laser for bearing irradiation; the carbon nanotubes which exceed the edge of the substrate facilitate gradual decomposition of the carbon nanotubes or GaN under laser radiation from the edge to the central part and discharging of generated gas; holes (with diameters of 200-800nm) remain at occupation positions of the carbon nanotubes; and finally a thick GaN film is grown, thereby obtaining a thick GaN film substrate or obtaining a self-supporting GaN substrate through a substrate removing process or a self-separation process. The preparation method of the GaN substrate has advantages of simple operation, easy control of technological conditions, low price and high convenience in large-scale batch production. Different substrates can be selected. Furthermore the preparation method supports a plurality of substrate separation processes.

Description

technical field [0001] The invention belongs to the field of preparation of optoelectronic devices, and relates to a preparation method of a GaN substrate. Background technique [0002] Group III nitride semiconductors have gradually developed into a new generation of lighting sources due to their advantages such as long life, energy saving, environmental protection, rich colors, safety and stability. GaN-based semiconductor devices are developing rapidly and have broad market prospects. However, due to the limitation of heteroepitaxy, lattice mismatch and thermal mismatch make the preparation of high-quality GaN materials very difficult. In particular, high-brightness white LEDs, blue LDs, and high-power, high-frequency power devices urgently need homoepitaxial technology to reduce the defect density of the active layer and improve the thermal and electrical conductivity of the substrate. [0003] Due to the large lattice mismatch and thermal mismatch, the stress continuo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/02H01L21/20H01L33/00H01L33/32
CPCH01L21/02H01L21/20H01L21/205H01L33/00H01L33/32
Inventor 于彤军程玉田吴洁君韩彤张国义
Owner PEKING UNIV
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