Integrated Circuit Bypass Signal Differential Amplification Sampling System and Acquisition Method
A bypass signal and integrated circuit technology, applied in program control system, electrical program control, program control in sequence/logic controller, etc., can solve the problem that the bypass signal noise interference signal cannot be effectively removed, and the bypass signal is not easy to be accurate Acquisition and other issues, to achieve the effect of direct acquisition, improve acquisition accuracy and efficiency, and suppress logic noise
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Embodiment 1
[0029] Embodiment 1: Integrated circuit bypass signal differential amplification and sampling system.
[0030] Such as figure 1 As shown, the integrated circuit bypass signal differential amplification and sampling system of the present invention includes two parts: a control unit 7 and an acquisition unit 8. The control unit 7 passes through the first data interface 18 ( figure 2 ) It is connected with the acquisition unit 8 to control the acquisition process of the acquisition unit 8, send out the acquisition interrupt signal, adjust the delay parameters and filter parameters, receive the acquired digital bypass signal, and pass the second data interface 14 ( figure 2 ) Perform data interaction with the host computer and send the collected digital bypass signal to the host computer.
[0031] The control unit 7 can be a separate embedded board card, such as an FPGA board card, etc., or the part of the circuit and the acquisition unit can be integrated on the same board card.
[...
Embodiment 2
[0037] Embodiment 2: Integrated circuit bypass signal differential amplification sampling method.
[0038] The method for differential amplification and sampling of the integrated circuit bypass signal of the present invention includes the following steps:
[0039] a, settings figure 1 with figure 2 The set of integrated circuits shown bypass the signal differential amplification and sampling system.
[0040] b. Select an integrated circuit chip of the same model and same batch as the tested integrated circuit chip, and after it is determined to be a security chip after chip opening, reverse engineering analysis and logic testing, it can be used as a security chip for comparison test; it will be tested The integrated circuit chip is inserted into the first test socket 9 and the security chip is inserted into the second test socket 10.
[0041] c. Lead wires from the first terminal 1 and the second terminal 2 at both ends of the adjustable current-sense resistor 21, and connect to a ...
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