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Transmission electron microscope in-situ electrode sample platform

A transmission electron microscope and sample stage technology, applied in the direction of circuits, discharge tubes, electrical components, etc., can solve the problems of in-situ electric field and current observation of samples, and achieve reliable performance, low cost, and simple design

Inactive Publication Date: 2016-06-15
FUDAN UNIV
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Problems solved by technology

Commercial transmission electron microscopes can observe high-resolution images, energy loss spectra, and three-dimensional configurations of nanomaterial samples by using single-axis and dual-axis tilting. The observation of potential electric field and current, how to introduce electrodes in the limited sample stage space, conduct electrical measurements in real time, and reveal the electrical properties and microstructure changes of the unit under test in situ are current research problems and hot spots.

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  • Transmission electron microscope in-situ electrode sample platform
  • Transmission electron microscope in-situ electrode sample platform
  • Transmission electron microscope in-situ electrode sample platform

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Embodiment Construction

[0026] Below in conjunction with accompanying drawing and specific embodiment, further illustrate the present invention, should be understood that these embodiments are only for illustrating the present invention and are not intended to limit the scope of the present invention, after having read the present invention, those skilled in the art will understand various aspects of the present invention Modifications in equivalent forms all fall within the scope defined by the appended claims of this application.

[0027] Such as figure 1 and figure 2 As shown, a transmission electron microscope in-situ electrode sample stage is composed of five parts: a metal electrode 1, a sample tank 2, an enameled wire 3, a sample observation window 4 and a sample pressure ring 5. Place the sample to be tested in the region of the sample observation window 4, and fix it firmly with the sample pressure ring 5. There are four metal electrodes 1 on the head of the sample rod. The enameled wire ...

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Abstract

The invention belongs to the technical field of transmission electron microscope accessories, and specifically to a transmission electron microscope in-situ electrode sample platform. The sample platform comprises five parts: metal electrodes, a sample groove, an enamelled wire, a sample observation widow and a sample pressing ring; a Dewar tank is connected at the back end of the sample platform, and can be used for filling liquid nitrogen to realize temperature control at a temperature interval of 100K-373K; the sample platform is put into a Lorentz transmission electron microscope; an in-situ magnetic field coupling observation environment can be realized at different temperatures; and the observation range of the Lorentz imaging mode can be expanded. According to the sample platform, the sample can be observed under an atomic-scale resolution, and real-time electric and magnetic observation at different temperatures can be realized as well; and the relations and change rules of the electric and magnetic performances and the nanometer microstructures of to-be-tested units can be demonstrated in an in-situ manner.

Description

technical field [0001] The invention belongs to the technical field of transmission electron microscope accessories, in particular to a transmission electron microscope in-situ electrode sample stage device. Background technique [0002] Since the first transmission electron microscope (TEM for short) came out in the 1930s, transmission electron microscopy has become an important tool for characterizing nanomaterials. Especially in the past two decades, transmission electron microscopy technology has made great progress in the fields of spatial distribution rate, energy distribution rate, and time distribution rate represented by spherical aberration correction technology. Scientific and technological progress in the fields of biology and informatics has made great contributions. At the same time, as one of the important development directions of transmission electron microscopy, in-situ field technology provides a new physical image for in-depth scientific research in the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/20G01N23/22
CPCG01N23/2204H01J37/20
Inventor 车仁超王超赵雪冰张捷
Owner FUDAN UNIV
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