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Universality efficient synchrotron radiation visual representation method of crystal microstructure

A microstructure and universal technology, applied in the field, can solve the problems of cumbersome and time-consuming, and achieve the effect of high application value, improved processing speed, and simple data processing.

Active Publication Date: 2016-06-15
XI AN JIAOTONG UNIV
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Problems solved by technology

This analysis method is extremely time-consuming, and one analysis takes several days; at the same time, the operator of the calibration operation needs to perform tedious calibration on various parameters to obtain ideal calibration results

Method used

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  • Universality efficient synchrotron radiation visual representation method of crystal microstructure
  • Universality efficient synchrotron radiation visual representation method of crystal microstructure
  • Universality efficient synchrotron radiation visual representation method of crystal microstructure

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Embodiment Construction

[0055] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and understandable, the following in conjunction with the attached figure 2 The example samples shown illustrate in detail the specific implementation of the present invention.

[0056] attached figure 2 The example sample shown is the sample prepared by 3D printing technology, in the attached figure 2 In the backscattered electron imaging image used, it can be seen that there are microcracks 1 and several precipitated phases 2 in the sample area.

[0057] Step 1: The value obtained by each normal pixel point of the detector in the original spectrum obtained by the known synchrotron radiation micro-area Laue diffraction experiment on the sample of the embodiment is averaged to obtain the mean value I 平均 (x,y). Wherein, the detector error pixel includes the detector dead pixel and the seam of the detection original that compose the detector. Because the int...

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Abstract

The invention relates to a universality efficient synchrotron radiation visual representation method of crystal microstructure. The method includes following steps: step 1, acquiring average intensity in an original spectrum obtained at each point on a synchrotron radiation micro-area Laue diffraction experiment scanning sample; step 2, using a normalization means to eliminate influence of incident X-ray intensity in the average intensity acquired in the step 1 to acquire diffraction spectrum average intensity after normalization; step 3, drawing an image 1 related to contrast in a whole scanning area and microstructure according to the normalized diffraction spectrum average intensity acquired in step 2; step 4, fitting abnormal numeric values in the original spectrum; step 5, performing threshold filtering on the spectrum after being fitted in the step 4, and calculating average intensity of a diffraction spectrum; step 6, drawing an image 2 related to the contrast in the whole scanning area and the microstructure according to the diffraction spectrum average intensity acquired after threshold filtering so as to realize high-universality efficient synchrotron radiation visual representation of the crystal microstructure.

Description

technical field [0001] The present invention relates to the technical field of crystal microstructure characterization methods, in particular to a high-pervasive and high-efficiency synchrotron radiation visualization characterization method for crystal microstructures, which is suitable for fast visual analysis of synchrotron radiation micro-zone Laue diffraction data of crystals to obtain crystals The microscopic structure has the characteristics of high resolution, large penetration depth, good imaging effect, high universality, and fast processing speed. It can transform the complex synchrotron radiation data analysis process from cluster computing on a cluster computer platform to personal Computing on the computer platform, and its processing speed is only limited by the computer's reading and writing speed. Background technique [0002] The microstructure of materials such as grain boundaries, subgrain boundaries, precipitated phases, microcracks, etc. will have a gre...

Claims

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Application Information

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IPC IPC(8): G01N23/207G06T11/00
CPCG06T11/00G01N23/207
Inventor 陈凯朱文欣沈昊周光妮李尧
Owner XI AN JIAOTONG UNIV
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