A detector based on semiconductor laser and its parameter adjustment method

Abstract

The invention discloses a detector based on a semiconductor laser unit and a parameter adjustment method of the detector. The detector comprises a sample module, a collecting module and a service module, wherein the sample module is used for carrying a sample, the collecting module is used for collecting spectroscopic data of the sample through a collecting optical path based on the semiconductor laser unit under the control of an embedded operating system, the service module is used for processing the collected spectroscopic data through the embedded operating system, a cloud computing technology and a big data processing technology so as to obtain absorbancy and component index data of the sample, and the output end of the collecting module is connected with the input end of the service module. An optical source and an optical splitter are integrated through the semiconductor laser unit in the collecting module of the detector, so that the detector is smaller in size and lower in price; the embedded operating system, the cloud computing technology and the big data processing technology are integrated in the service module, so that the detector is more convenient to use, the dependency on a computer is reduced, the analysis speed is increased, and the analysis efficiency is improved. The detector can be widely applied to the spectroscopic detection field.

Description

technical field [0001] The invention relates to the field of spectrum detection, in particular to a semiconductor laser-based detector and a parameter adjustment method thereof. Background technique [0002] Near-infrared spectral analysis technology is a typical high-efficiency analysis technology. This spectral analysis technology is a testing technology developed in the early 1980s that can realize nondestructive testing. It is a modern electronic technology, spectral analysis technology, and computer technology. and a collection of stoichiometric techniques. [0003] The traditional near-infrared spectrum analyzer consists of five parts: light source, sample cell, spectrometer, detector and computer, and can be divided into two categories: fixed wavelength type and scanning type. [0004] The fixed wavelength type is divided into filter type and LED type. The filter type near-infrared spectrum analyzer uses several interference filters to split the light emitted by the ...

AI Technical Summary

Problems solved by technology

The grating-type near-infrared analyzer uses a grating for light splitting. Due to the limitation of the slit, its resolution and sensitivity are low, and it has strict requirements on the optical path. The external light intensity will affect the test results and the scanning speed is slow.

Due to the moving parts of the Fourier-type near-infrared analyzer, shaking and deflection will occur during the scanning process, resulting in instability of the interference signal and reducing its sensitivity

Acousto-optic tunable filter type (A0TF type) near-infrared analyzer splits the composite light by controlling the arrangement of crystals with an alternating electric field. Results of the analysis

The light emitted by the light source of the multi-channel near-infrared analyzer passes through the sample and then focuses on the fixed grating. The light dispersed by the holographic grating is detected by the multi-channel detector at the same time. The disadvantage is that the dynamic range is limited and it is sensitive to temperature.

[0006] As mentioned above, due to the complexity of the light source and spectroscopic system, the traditional near-infrared spectrum analyzer is generally relatively large and expensive, and in order to complete the measurement, it must be equipped with a dedicated computer and installed on the computer. The unique analysis model of the instrument can only work, which is not convenient enough and relies too much on the processing speed of the computer itself, and the analysis efficiency is low when the analysis model is complex

In addition, there is currently a lack of parameter adjustment methods for near-infrared spectrometers in the industry, which cannot guarantee that the near-infrared spectrometer will collect and analyze spectral data in an optimal state, which is not stable enough.

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