Wafer testing system and method
A wafer testing and wafer technology, applied in the electronic field, can solve the problems of inflexible testing, high cost, long cycle, etc., and achieve the effect of shortening the testing cycle, reducing the testing cost and improving the testing efficiency
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[0034] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for the convenience of description, the drawings only show some but not all of the contents related to the present invention.
[0035] figure 1 is a schematic diagram of a carrier board in a wafer testing system provided by an embodiment of the present invention, figure 2 It is a schematic diagram of a wafer to be tested in a wafer testing system provided by an embodiment of the present invention. The following is combined with figure 1 and figure 2 to describe the embodiments of the present invention.
[0036] The wafer testing system includes a flying probe tester and a carrier board, the flying probe tester is used to test the wafer to be test...
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