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Space modulation static-state interference spectrum imaging instrument interferogram optical splicing method

A spectral imager and static interference technology, applied in the field of spectral imaging, can solve the problem that the size of the photodetector area array cannot meet the requirements of high spectral resolution, and achieve the requirements of reducing the number of spectral dimension lines and improving the spectral resolution Effect

Inactive Publication Date: 2014-11-26
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0006] The purpose of the present invention is to provide a spatially modulated static interference spectrum imager interferogram optical splicing method, which solves the technical problem that the photodetector area array specifications in the background technology cannot meet the high spectral resolution requirements

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  • Space modulation static-state interference spectrum imaging instrument interferogram optical splicing method
  • Space modulation static-state interference spectrum imaging instrument interferogram optical splicing method
  • Space modulation static-state interference spectrum imaging instrument interferogram optical splicing method

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Embodiment Construction

[0030] The principle of the present invention is: when the number of detector spectral dimensions cannot meet the requirements of the system design for the number of sampling points in the interferogram, a mirror surface can be set in front of the image to divide the image surface in the spectral direction, and N detectors (N≥ 2) Collect and transform the interferograms separately; then use the characteristic of the symmetrical distribution of the interferograms on both sides of the zero optical path difference position, and splicing the output images of multiple detectors to obtain the interference images that meet the data processing requirements.

[0031] The concrete implementation method of the present invention is as follows:

[0032] The interferogram optical mosaic method of the spatially modulated static interference spectrum imager comprises the following steps:

[0033] 1] Divide the target signal into two completely coherent light beams, and then perform interferen...

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Abstract

The invention relates to a space modulation static-state interference spectrum imaging instrument interferogram optical splicing method. When a detector spectrum dimension row number cannot satisfy the requirement of a system design for an interferogram sampling point number, a reflector surface can be arranged before an image plane for segmenting the image plane in a spectrum direction, and an interferogram is respectively sampled and converted by use of N detectors (N>=2); and by use of a characteristic that the interferogram is syemtrically distributed at the two sides of a zero light path difference position, after output images of multiple detectors are spliced, an interference image satisfying a data processing requirement is obtained. The method provided by the invention solves the technical problem of incapability of the array specification of a photoelectric detector in satisfying a high-spectrum resolution requirement.

Description

technical field [0001] The invention relates to a spectral imaging technology, in particular to an interference spectral imaging technology. Background technique [0002] Spectral imaging technology combines spectral technology and imaging technology, and simultaneously obtains the geometric characteristics and radiation characteristics of the target to realize the comprehensive detection and identification of target characteristics. With the continuous improvement of space remote sensing applications for fine identification of target characteristics, the spectral resolution and spatial resolution indicators of spectral imaging instruments have been continuously improved. [0003] The spectral imaging technology applied to space remote sensing mainly has two technical principles: dispersion type and interference type. Interferometric spectral imaging technology has the characteristics of high sensitivity, high spectral resolution and high throughput, and can meet the requir...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45
Inventor 刘强李思远陈小来王爽李芸李然
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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