TDI-type CMOS image sensor accumulation circuit for reinforcing single event effect
An image sensor, single-event effect technology, applied in the direction of image communication, television, electrical components, etc., to achieve convenient effects
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[0012] On the basis of the working sequence of the TDI CMOS image sensor, the present invention proposes a method for strengthening single event effects of pixels based on time domain redundancy. This method requires that the TDI type CMOS image sensor has an integral multiple of 3 accumulation stages. The following describes the simplest three-level accumulation process. Such as figure 2 As shown, for the 3-level accumulation TDI CMOS image sensor, the exposure and readout time of each row is unchanged, but the readout data of the first row and the second row at the interval of TL are firstly converted into digital-to-analog conversion and stored in the memory A And in memory B, after the data read out by the pixels in the third row after TL is quantized and stored in memory C, at this time, memory A, memory B and memory C store three rows of pixels for the same part of the object to be photographed Data output after imaging. The values in the memory A, the memory B and...
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