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Time digital conversion method and time digital converter

A technology of time-to-digital conversion and converter, which is applied in the electronic field and can solve the problems of different measurement accuracy of delay units

Active Publication Date: 2014-08-13
HUAWEI TECH CO LTD
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, in actual implementation, there is a mismatch between each delay unit, that is, the measurement accuracy of each delay unit is not the same

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  • Time digital conversion method and time digital converter

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Embodiment Construction

[0050] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0051] Generally speaking, important indicators to measure the pros and cons of TDC include measurement accuracy, measurement range, and linearity. Among them, the measurement accuracy refers to the minimum input time difference that the TDC can distinguish, and this performance directly affects the in-band noise performance of the ADPLL. Fo...

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Abstract

The embodiment of the invention provides a time digital conversion method and a time digital converter. The method comprises the following steps that a phase lead signal and a phase lag signal are determined; through N selection signals, the phase lead signal is converted into N phase lead sub-signals, and the phase lag signal is converted into N phase lag sub-signals; the N phase lead sub-signals are input into N delay units, corresponding to the N phase lead sub-signals one to one, of a first delay chain respectively, and the N phase lag sub-signals are input into N delay units, corresponding to the N phase lag sub-signals one to one, of a second delay chain respectively; in each measurement period, the delay units of the phase lag sub-signals ahead of the phase lead sub-signals are determined, a phase difference between a reference clock and a feedback clock is converted into the stage number j of the delay units which are passed previously and then the stage number j is output; the extent of variation of the TDC gain is reduced, and the problems of linearity reduction and burrs caused by adaptation among the delay units are solved.

Description

technical field [0001] Embodiments of the present invention relate to electronic technology, and in particular to a time-to-digital conversion method and a time-to-digital converter. Background technique [0002] The Time-Digital Converter (TDC) in the All Digital Phase-Locked Loop (ADPLL) is mainly used to compare the phases of the high-precision reference clock and the feedback clock to obtain the phase difference. The phase difference is converted into a digital signal and output to the loop filter to control the frequency of the digital-controlled oscillator (Digital-Controlled Oscillator, DCO), so that the oscillation frequency of the DCO is N times the reference clock, where N is the N frequency divider The frequency division ratio, the feedback clock is, for example, the DCO or the feedback clock after the frequency division of the DCO. Important indicators of TDC include measurement accuracy, measurement range and linearity. [0003] In the prior art, in order to o...

Claims

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Application Information

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IPC IPC(8): H03L7/08H03L7/18
Inventor 毛懿鸿高鹏朱年勇
Owner HUAWEI TECH CO LTD
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