Drop test table

Abstract

The invention provides a drop test table, and belongs to the technical field of shock test equipment. The drop test table is composed of a supporting system, a lifting drop system and a secondary-shock-preventing drop system. The supporting system comprises guide rails (1) and a shock pad (2). The four guide rails (1), an upper drop table surface (21) and a lower drop table surface (22) form a cube to support the whole test table and guarantee the stability and guidance performance. The shock pad (2) is arranged on the bottom of the test table. The lifting drop system comprises a rigid base (3) and a collision plane (4). The top end of the rigid base (3) is of a half-round shape. The collision plane (4) is fixed below a drop table surface (18). The drop test table is good in stability and repeatability. Different shock accelerated speeds can be obtained by adjusting the elevation height of the drop table surface, the test requirements under different conditions can be met, secondary shock is avoided, operation is simple, and a man-made influence factor is small.

Description

technical field [0001] The invention is a device for testing the reliability of electronic products including their components and joint-level solder joints, especially a drop test bench, which is a device for testing the reliability of electronic products including their components and joint-level solder joints, as a result of the work done by the acceleration of gravity, resulting in a mechanical impact force generated by the collision between the falling table and the rigid base. Background technique [0002] With the development of electronic products in the direction of thinner, lighter, shorter, and smaller, especially the increasing speed of replacement, traditional heat, electricity, and magnetism are no longer the main factors affecting the reliability of electronic products, but in the process of transportation or use Among them, due to the macroscopic mechanical impact force of the electronic product caused by accidental drop, it may cause failure from the shell to...

AI Technical Summary

Problems solved by technology

However, the description of the drop test rig in this standard is not very detailed, only the shape of a typical drop test device is given, but for the drop test, the stability and ease of handling of the drop test rig determine the reliability of the drop. The key factors of whether sexual evaluation has reference value

At present, most of the drop equipment sold in the market is concentrated on the test of the packaging box. The experimental conditions such as the acceleration amplitude and pulse duration are relatively low compared with the JCDEC standard, and the price is expensive, which cannot meet the drop test conditions for electronic products. On the other hand, according to the standard, it is still difficult to achieve the experimental conditions without secondary impact during the drop process, especially for laboratories, the drop equipment built by themselves often has poor stability and repeatability, and There are many human-influenced factors, which lead to large errors in the evaluation and prediction of drop reliability

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