Memory fault injection method and simulator thereof for software built-in test (BIT)

Abstract

The invention provides a memory fault injection method and a simulator thereof for a software BIT. A hardware circuit board carrying out BIT software serves as a mock object of the simulator. An analog module for simulating normal functions of a memory, a fault modeling and model analysis module for establishing and analyzing fault sequence files, a fault injection module for matching the faults to be injected, and a fault behavior analog module and a peripheral cross-linking environment simulation module are added to the simulator. The method includes establishing a fault mode base, writing and analyzing extensive makeup language (XML) fault sequence files into identifiable fault sequences, searching and injecting corresponding faults when a processor accesses the memory, and performing fault simulation when the faults are triggered. According to the method and the simulator, the injected fault modes are complete and fully cover test cases under each fault occurrence for the memory, sufficient tests can be performed on the BIT software on a circuit board level, and only the BIT software after the sufficient tests can guarantee accuracy and timeliness of BIT fault prediction of aeronautical airborne equipment and further guarantee system reliability and safety.

Description

technical field [0001] The invention relates to a fault injection technology in reliability engineering and a memory technology in computer engineering, in particular to a memory fault injection method and a simulator for BIT software testing. Background technique [0002] No matter how high the reliability of a system, equipment or product is, it cannot guarantee that it will always work normally. Users and maintainers must monitor its health status and know whether there is a fault or where a fault has occurred, so it must be monitored and tested. . Therefore, it is hoped that the system and equipment itself can provide convenience for this purpose. The characteristics of this kind of system and equipment that are convenient for monitoring their health status and easy for fault diagnosis and testing are the testability of the system and equipment. Testability refers to a design characteristic of a product that can promptly and accurately determine its state (working, non-...

AI Technical Summary

Problems solved by technology

[0005] However, traditional fault injection technology faces many problems: Although hardware-based fault injection technology injects real hardware faults, it is limited by the high density of components on the circuit board, and there is not enough space for additional hardware fault injection equipment such as probes and sockets. , and the internal faults of the more concerned components cannot be injected; software-based fault injection technology has various benefits in other applications, but the code of BIT software is not open (or not allowed to be modified), the operating structure is complex, and the accessibility is poor , so software fault injection has nowhere to start in BIT software testing; finally, although the fault injection technology based on simulation / simulation implemented by hardware description languages ​​such as VHDL and Verilog can accurately simulate the hardware environment in which BIT software runs, it cannot support BIT software runs on it, and it is impossible to talk about it as a software testing tool

In terms of dynamic testing, limited by professional knowledge, environmental technical conditions, etc., there are two problems: (1) In the design of test cases, there is a lack of comprehensive analysis of electronic equipment systems, and the design of abnormal use cases is not comprehensive enough; ( 2) Considering the abnormal use cases designed by the BIT software to detect the fault mode, but due to the functional characteristics of the BIT software itself, the application of some abnormal use cases needs to inject faults into the actual hardware to realize

However, the hardware fault injection method cannot be applied to high-density electronic equipment

In this way, many use cases cannot be executed even if they are designed

These reasons lead to insufficient BIT software testing, so that many problems are only discovered in the actual use process, causing serious consequences

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