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Test data encoding compression method

A technology of test data and encoding compression, which is applied in the field of data encoding, can solve the problems of large amount of data and affect the compression rate, etc., achieve the effect of double compression and improve the test data compression rate

Inactive Publication Date: 2012-07-18
INST OF ACOUSTICS CHINESE ACAD OF SCI
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Problems solved by technology

[0008] The disadvantage of the above encoding method is that the encoding method has a large amount of data when performing external encoding, which affects the compression rate

Method used

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Embodiment Construction

[0015] The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments.

[0016] figure 1 It is a flow chart of a test data encoding and compression method based on filling of irrelevant bits (indicated by X) according to an embodiment of the present invention. Such as figure 1 As shown, the method includes steps 100-400.

[0017] The method first defines three bit operations on the test data, including XOR Intersection (∩) and negation (!), the operation rules are:

[0018] XOR : 1 / 0 / X ⊕ X = X , 1 ⊕ 0 = 1 , 0 ⊕ 0 = 1 ⊕ 1 = 0 ;

[0019] Intersection (∩): 1 / X ∩1=1, 0 / X ∩0=0, X / X=X;

[0020]...

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Abstract

The invention relates to a test data encoding compression method. The test data encoding compression method comprises the following steps of: segmenting original test data by using L as a data section length, wherein L is a positive integer power of 2; if the length of the last data section is less than L bits, then filling X-bits at the tail part of the last data section to complement the residual bits, and obtaining a plurality of data sections; respectively carrying out external compatibility analysis on the plurality of data sections, carrying out backtracking and value assignment on the X-bits in the data sections according to an external compatibility analysis result; carrying out internal compatibility analysis on the data sections without external compatibility to obtain internal encoding types of the data sections and generate corresponding internal reference data sections; and obtaining encoding code words of the data sections according to an encoding rule and the external compatibility analysis result or according to the encoding rule, the external compatibility analysis result, the internal encoding types and the internal reference data sections. The invention has the characteristics of realizing double compression of the test data and improving test data compression ratio.

Description

technical field [0001] The invention relates to data encoding technology, in particular to a test data encoding and compression method. Background technique [0002] Automatic Test Equipment (ATE) is used to detect the integrity of integrated circuit functions, and is the final process of integrated circuit manufacturing to ensure the quality of integrated circuit manufacturing. [0003] With the increase in the scale of integrated circuit design, the amount of data to be tested has shown an exponential growth, which has led to severe problems such as insufficient storage space for traditional external ATE, limited bandwidth for input and output, and long data test time. The test cost Higher and higher. Test data compression is one of the effective methods to solve the above problems. By compressing test data, data transmission time can be reduced and the requirement for ATE storage capacity can be reduced. Coding compression method is one of the most commonly used methods...

Claims

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Application Information

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IPC IPC(8): G11C29/56
Inventor 吴殿丞王东辉洪缨侯朝焕
Owner INST OF ACOUSTICS CHINESE ACAD OF SCI
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