Intelligent overcurrent protection circuit for integrated circuit test system

Abstract

The invention discloses an intelligent overcurrent protection circuit for an integrated circuit test system, which comprises a half-bridge inversion unit, an overcurrent detection unit, a timing unit and a load equivalent unit, wherein the half-bridge inversion unit is connected with the overcurrent detection unit, and the overcurrent detection unit is connected with the timing unit and samples current in the load equivalent unit. When the overcurrent detection unit detects that the continuous time of an overcurrent signal is longer than the time preset by the timing unit, the integrated circuit test system is locked; otherwise an overcurrent phenomenon is neglected, and the integrated circuit test system normally works. The Intelligent overcurrent protection circuit for the integrated circuit test system is applied in the integrated circuit test system, can improve interference resistance to false triggering and capacitance coupling, further improve the stable performance of a whole circuit and improve the integral reliability of the integrated circuit test system.

Description

technical field [0001] The invention relates to an overcurrent protection circuit, in particular to an intelligent overcurrent protection circuit applied in an integrated circuit test system, and belongs to the technical field of integrated circuit test. Background technique [0002] In an integrated circuit test system, an overcurrent situation often occurs due to a failure of the integrated circuit to be tested. Without proper over-current protection measures, the entire IC test system may be damaged due to a short-circuit fault of the IC under test. Sometimes due to the poor load capacity of the integrated circuit to be tested, the entire integrated circuit test system fails, which is extremely uneconomical from an economic point of view. Therefore, the design of the integrated circuit test system needs to properly consider the overcurrent protection capability. [0003] In existing integrated circuit test systems, power switching devices often use power MOS tubes, but ...

AI Technical Summary

Problems solved by technology

[0006] The advantage of the above overcurrent protection circuit is that the design is simple, but the problem is: when the frequency of the input signal is within the resonant frequency range of the LCR series resonant circuit, a large current is generated in the LCR series resonant circuit; and the frequency of the input signal exceeds this In the frequency range, the current generated in the LCR series resonant circuit is very small

This obviously interferes with the normal operation of the integrated circuit test system

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