Method for correcting overlap of X ray fluorescent spectroscopy spectral lines

Abstract

The invention discloses a method for correcting overlap of X ray fluorescent spectroscopy spectral lines. The method comprises the following steps of: (1) overlapping a YKa spectral line of a Y element with an XLa spectral line of an X element, wherein the real intensity I1<Y> of the YKa spectral line of the Y element is equal to I<Y> measured-I1<X>; (2) selecting a standard sample which contains the Y element and does not contain the X element and establishing a calibration curve according to the percentage composition Wi of the Y element and the measured real total fluorescent intensity Ii of the Y element, wherein a calibration curve formula is that: Wi=a*Ii+bY, and the element sensitivity M=1 / a; (3) with respect to of the standard sample which contains the Y element and does not contain the X element, calculating the XLa overlap fluorescent intensity I1<X>=K*IXKA=M*C at the YKa, wherein a spectral line overlap correction coefficient K=I<Y> measured-M*c / IXKA; and (4) measuring the fluorescent intensity of the corrected spectral line of the Y element, wherein the fluorescent intensity is real intensity I1<Y>=I<Y> measured-K*IXKA. The method has the advantages of lowering production test cost and simplifying a spectral line overlap intensity correction method.

Description

technical field [0001] The invention is used for X-ray fluorescence spectroscopic analysis spectral line overlap correction. Background technique [0002] Line overlap and matrix effect are the two main factors that affect the accuracy of X-ray fluorescence spectroscopy. When the fundamental parameter (FP) is used to correct the matrix effect, the intensity of line overlap must be corrected first to obtain the true fluorescence intensity. The existing spectral line overlap intensity correction is to measure the spectral line overlap correction coefficient with the pure element method, and then apply the spectral line overlap correction coefficient to calculate the real fluorescence intensity. The problems and deficiencies of this method are as follows: ① It is difficult to obtain pure metals from some elements in practical applications, and the available pure metals are also relatively expensive. ②The method of measuring spectral line overlap correction coefficient by pure ...

AI Technical Summary

Problems solved by technology

The problems and deficiencies of this method are as follows: ① It is difficult to obtain pure metals from some elements in practical applications, and the available pure metals are also relatively expensive

②The pure element method to measure the spectral line overlap correction coefficient is cumbersome, and it is applied to the alloy system. When the line system used for measurement has the absorption enhancement effect of other elements, the measured spectral line overlap correction coefficient cannot be used.

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