Device for testing single event upset fault resistance of on-board software

Abstract

The invention relates to a device for testing a fault of satellite on-board software, and discloses a device for testing the single event upset fault resistance of on-board software, which comprises an on-board data managing computer (2), an on-board computer run testing environment (3), a remote injected data receiving device (4), a telemetry data processing device (5) and a fault simulating module (1), wherein the on-board data managing computer (2) is used for running on-board control software; the on-board computer run testing environment (3) is used for observing the danger of the occurrence of the single event upset fault of the on-board software and the time of the fault recovery; the remote injected data receiving device (4) is used for receiving a command, data and a program from the ground; the telemetry data processing device (5) is used for displaying the run state and the fault record of the on-board software; and the fault simulating module (1) is used for automatically simulating a single event upset fault event in a timing manner. The invention solves the problem of on-board apparatus fault test and the single event or electromagnetic pulse jamming, thereby realizing the purposes of evaluating the effectiveness of the measure of resisting the single event and improving the enhancement of the on-board software.

Description

technical field [0001] The invention relates to a satellite on-board software failure testing device, more specifically, a test device for the on-board software anti-single-event overturn fault. Background technique [0002] Man-made earth satellites work in very harsh space environment conditions. Large-scale integrated circuits such as CPU and memory in the space-borne computer will encounter the bombardment of space high-energy particles at any time in the space environment, that is, single event upset event (SEU), static electricity, etc. The high-voltage electromagnetic pulses formed by the discharge or various disturbances formed in the EMC environment cause the failure of the large-scale integrated circuits in the spacecraft to flip. The impact of this type of failure on the on-board computer is mainly manifested in the flight of the program or the error of the storage unit. In order to eliminate the impact of SEU events, spaceborne software usually takes various err...

AI Technical Summary

Problems solved by technology

At present, there is no description or report of the similar technology of the present invention, and no similar data at home and abroad have been collected yet.

Images