Asymmetrical fast thyristor
A thyristor, asymmetric technology, applied in the direction of thyristor, electrical components, circuits, etc., can solve problems such as adverse effects on overall device stability and reliability, limitation of current capacity, poor dynamic characteristics, etc., to improve on-state capacity, reduce Stores charge and improves recovery softness
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Embodiment 1
[0017] Example 1 as Figure 4 shown. The asymmetric thyristor includes a tube shell and a PNPN four-layer three-terminal semiconductor chip packaged in the tube shell. The junction depth of P1 anode area 1 is 15-80 μm; the junction depth of P2 area 3 at the cathode end is 45-130 μm, and the surface concentration is 1.5-8x10 17 cm -3 ; The thickness of the long base region 2 of N1 is 110-350 μm; the P in the anode region 1 of P1 + The surface concentration of high concentration area 8 is 2x10 19 ~9.5x10 20 cm -3 . The junction depth of the P1 anode region 1 of the semiconductor chip is 20% to 70% of the junction depth of the P2 region 3 at the cathode end, and the thickness of the N1 long base region 2 is 20% to 30% thinner than that of a general thyristor. The P in the P1 anode region 1 + High concentration region 8 is formed by single window diffusion, P + The junction depth of the high concentration region 8 is smaller than the junction depth of the anode region 1 of...
Embodiment 2
[0035] Example 2 as Figure 5 shown. The difference from Example 1 is that the P+ high-concentration region 9 in the P1 anode region 1 is formed by multi-window diffusion, and the P + The junction depth of the high concentration region 9 is smaller than the junction depth of the anode region 1 of P1.
Embodiment 3
[0036] Example 3 as Image 6 shown. The difference from Example 1 is that the P+ high-concentration region 10 in the anode region of P1 is formed by multi-window diffusion, and the P + The junction depth of the high concentration region 10 is greater than the junction depth of the anode region of P1.
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