Method for extracting electromagnetic parameters of artificial electromagnetic material based on support vector machine (SVM)

Abstract

The present invention is a method for extracting electromagnetic parameters of artificial electromagnetic material based on support vector machine (SVM). The invention relates to a new method for researching electromagnetic parameter measurement, capable of testing shield-hand material and artificial electromagnetic material having a periodic structure, and the testing result precision is high andthe production of testing samples is simple. The support vector machine (SVM) method is based on a VC-dimension theory of a statistical learning theory and a structure risk minimum principle, seeks an optimum compromise between the complexity and the learning capacity of a model based on limited sample information so as to obtain best popularization capability, and is widely applied to statistical classification and regression analysis. According to the invention, transmission and reflection coefficients of material to be tested are calculated by numerical computation methods FEM and FDTD ofelectromagnetism, and the corresponding computed result is used as training sequences to train the the support vector machine. When the support vector machine is trained fully, it is capable of calculating equivalent dielectric constant and equivalent magnetic conductance of the material to be tested by inputting testing values of the transmission and reflection coefficients.

Description

technical field [0001] The invention relates to the field of measuring equivalent electromagnetic parameters of artificial electromagnetic materials. More specifically, the present invention is devoted to a method for measuring equivalent electromagnetic parameters of artificial electromagnetic materials by combining support vector machine method (SVM) with computational electromagnetics method. Background technique [0002] Artificial electromagnetic materials have unique electromagnetic properties and potential application prospects, and a new field has been created for its research. With its development, new technological breakthroughs will be produced in the application fields such as wireless communication technology, radar technology, nanotechnology and microelectronics technology. Therefore, research on the design and fabrication methods of artificial electromagnetic materials, research on parameter testing methods, and research on applications have always been hot r...

AI Technical Summary

Problems solved by technology

[0004] First, there will be a phase error problem of the transmission coefficient. Although this problem has been solved to a certain extent, there will still be some errors at the half-wavelength frequency point;

[0005] Second, material samples are difficult to make, especially in the coaxial line measurement model, the test material requires high processing accuracy, and will cause damage to the material itself, therefore, some materials with complex periodic structures are often difficult to process into test sample;