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Phase change memory devices and methods of manufacturing the same

a memory device and phase change technology, applied in the direction of bulk negative resistance effect devices, basic electric elements, electric devices, etc., can solve the problems of undesired conduction path not being formed, no efficient method of forming and/or arranging heat sinks, etc., to achieve the effect of enhancing heat absorption and reducing thermal disturbance between cells

Inactive Publication Date: 2013-12-05
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The patent text describes a phase change memory device with a heat sink arranged efficiently. The heat sink is located between the lower electrodes and is electrically insulated from the rest of the device to prevent unwanted electrical conductivity. The heat sink is positioned close to the plug to facilitate heat transfer. This arrangement reduces thermal disturbance and enhances heat absorption, resulting in improved device performance.

Problems solved by technology

In order to solve the problem, a heat sink absorbing Joule heat has been developed, however, there is no efficient method of forming and / or arranging the heat sink.
Additionally, the heat sink may be electrically insulated and spaced apart from the phase change memory unit including the lower electrode, the phase change material layer pattern and the upper electrode, and thus an undesired conduction path may not be formed.

Method used

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  • Phase change memory devices and methods of manufacturing the same
  • Phase change memory devices and methods of manufacturing the same
  • Phase change memory devices and methods of manufacturing the same

Examples

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Embodiment Construction

[0083]Various embodiments will be described more fully hereinafter with reference to the accompanying drawings, in which some embodiments are shown. The present inventive concept may, however, be embodied in many different forms and should not be construed as limited to the particular embodiments set forth herein. Rather, these embodiments are provided so that this description will be thorough and complete, and will fully convey the scope of the present inventive concept to those skilled in the art. In the drawings, the sizes and relative sizes of layers and regions may be exaggerated for clarity.

[0084]It will be understood that when an element or layer is referred to as being “on,”“connected to” or “coupled to” another element or layer, it can be directly on, connected or coupled to the other element or layer or intervening elements or layers may be present. In contrast, when an element is referred to as being “directly on,”“directly connected to” or “directly coupled to” another e...

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Abstract

A phase change memory device includes a phase change memory unit and a heat sink. The phase change memory unit includes a phase change material layer pattern, a lower electrode beneath the phase change material layer pattern configured to heat the phase change material layer pattern, and an upper electrode on the phase change material layer pattern. The heat sink configured to absorb heat from the phase change memory unit. The heat sink has a top surface lower than a top surface of the upper electrode and is spaced apart from the phase change memory unit.

Description

CROSS-REFERENCE TO RELATED APPLICATION[0001]This application claims priority under 35 USC §119 to Korean Patent Application No. 10-2012-0059323, filed on Jun. 1, 2012 in the Korean Intellectual Property Office (KIPO), the contents of which are herein incorporated by reference in their entirety.BACKGROUND[0002]1. Field[0003]Embodiments relate to a phase change memory device and a method of manufacturing the same. More particularly, example embodiments relate to a phase change memory device having a heat sink and a method of manufacturing the same.[0004]2. Description of the Related Art[0005]In a phase change memory device, Joule heat generated in a lower electrode and / or a phase change material layer in a memory cell may affect the crystallization of a phase change material layer in adjacent memory cells to cause a thermal crosstalk. In order to solve the problem, a heat sink absorbing Joule heat has been developed, however, there is no efficient method of forming and / or arranging th...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01L45/00
CPCH01L45/1286H10B63/20H10B63/80H10N70/231H10N70/8413H10N70/8613H10N70/826H10N70/8828H10N70/066H10N70/011H10N70/8825H10N70/021
Inventor PARK, TAE-JINSONG, YOON-JONGCHUNG, CHIL-HEE
Owner SAMSUNG ELECTRONICS CO LTD
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