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Detection of surface defects employing subsampled images

a surface defect and subsampling technology, applied in image enhancement, image data processing, instruments, etc., can solve problems such as object inspection systems, achieve the effects of reducing limitations, improving the functionality of object inspection systems, and increasing the diversity of objects

Inactive Publication Date: 2007-06-14
ORBOTECH LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present invention provides an improved apparatus and method for visually inspecting objects and analyzing color images, especially for multi-material patterned objects such as ball grid array substrates, printed circuit boards, and laminated printed circuit boards. The apparatus and method can inspect and analyze a variety of objects and materials, and can distinguish between different areas on an image using optical characteristics such as color, shape, and surface residues. The invention also provides improvements in processing monochrome images and identifying borders in color images.

Problems solved by technology

All prior art object inspection systems suffer from certain limitations which make them useful for inspecting only certain types of objects, even if the objects being inspected are limited to the fields of printed circuit boards, integrated circuits, and similar electronic components.

Method used

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  • Detection of surface defects employing subsampled images
  • Detection of surface defects employing subsampled images
  • Detection of surface defects employing subsampled images

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Embodiment Construction

Overview

[0284] Reference is now made to FIG. 1 which is a simplified block diagram illustration of an image analysis system 100 constructed and operative in accordance with a preferred embodiment of the present invention. It is appreciated that, while the system of FIG. 1 is particularly useful in analyzing an image which represents a patterned object, for example a BGA or other electric circuit, the system of FIG. 1 may generally be useful in image analysis, whether or not an image being analyzed represents a patterned object or any other object. Although reference in the present specification is made to BGAs for the purposes of illustrating the present invention, the term BGA as used in the present specification shall be deemed to refer to and additionally include printed circuit board substrates, laminated printed circuit boards, lead frames, flat panel displays, hybrid chip packaging substrates, tape automated bonding substrates, and any suitable patterned object including vari...

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PUM

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Abstract

A method for determining a location of a border in a color image, the image including at least two color populations, between a first color region associated with a first one of the two color populations and a second color region associated with a second one of the two color populations, both the first color region and the second color region being in the color image, the method includes identifying an approximate border location between the first color region and the second color region, determining a plurality of candidate border locations between the first color region and the second color region, each of the plurality of candidate border locations being determined by applying a corresponding border location method chosen from among a plurality of border location methods, choosing one method from among the plurality of border location methods as a preferred method, and determining a location of a border between the first color region and the second color region by designating one of the plurality of candidate border locations associated with the preferred method as the border. Also, an automated optical inspection device suitable for inspection of patterned articles.

Description

FIELD OF THE INVENTION [0001] The present invention relates to apparatus and methods for analyzing images, especially but not exclusively color images, and more specifically to apparatus and methods of image analysis which are useful in inspection of a patterned object. BACKGROUND OF THE INVENTION [0002] Apparatus and methods for analyzing images, and in particular for image analysis which is useful in inspection of a patterned object, are well known in the art. [0003] The following references describe image processing methods which may be useful in understanding the present invention: [0004] C. Gonzalez and P. Wintz, Digital Image Processing, Addison Wesley, Reading, M A, 1987; and [0005] John C. Russ, The Image Processing Handbook, CRC Press, 1994. [0006] The following references describe edge detection methods which may be useful in understanding the present invention: [0007] D. Marr and E. Hildreth, Theory of Edge Detection, Proceedings of the Royal Society of London; and [0008]...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G06K9/00G01B11/00G01N21/88G01N21/956G06T1/00G06T5/00G06T7/00G06T7/60
CPCG06K9/0014G06T7/0004G06T7/0083G06T7/0091G06T2207/10016G06T2207/30141G06T7/12G06T7/155G06V20/695
Inventor GOLD, URIPARENTE, ELIGILAT-BERNSHTEIN, TALLYBARANOVSKY, EDWARDMARGALIT, TAMIR
Owner ORBOTECH LTD
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