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Internal photo ionization ion trap quality analyzer and method thereof

A mass analysis device and mass analysis technology, applied in the direction of measuring devices, analysis materials, material separation, etc., can solve the problems of damage selectivity and sensitivity, small detectable concentration, limit, etc., to improve relative sensitivity, improve detection limit, Achieve the effect of miniaturization

Active Publication Date: 2006-08-02
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  • Description
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AI Technical Summary

Problems solved by technology

[0015] (1) Limited dynamic range, especially in small quadrupole systems, limits the minimum detectable concentration;
[0016] (2) Significant fragments of the compound to be tested will be generated during the ionization process of the 70eV EI source, and the analysis will be easily hindered by the interference of other pollutants or air components
[0020] Ionization with an EI source of 12eV is impractical due to the unavoidable large energy broadening of the electrons, and the EI ionization efficiency is rather low near the ionization energy threshold, severely compromising selectivity and sensitivity

Method used

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  • Internal photo ionization ion trap quality analyzer and method thereof
  • Internal photo ionization ion trap quality analyzer and method thereof

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Embodiment Construction

[0052] The internal photoionization ion trap mass analysis device and method thereof of the present invention will be described in detail below with reference to the accompanying drawings.

[0053] The "enrichment" in the present invention means a large amount of collection and continuous concentration, which is characterized by continuously collecting and increasing the required sample substances after ionization, while removing unnecessary substances. Enrichment has an obvious positive effect on the determination of trace and trace elements, but has no obvious advantage on the determination of elements with general content.

[0054] Before the present invention, the conventional treatment process is: after the air is ionized in the ion source, it enters the mass analyzer through the ion optical system, and the mass analyzer separates ions with different mass-to-charge ratios and detects them on the detection system , record its ionic strength.

[0055] Because of the extrem...

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Abstract

The present invention relates to an internal photoionization ion trap quality analysis device and its method. Said device includes ion source for making ionization treatment of gas-phase sample and ion trap for making separation treatment of ion, in which the ion source is UV light source, and is placed outside of ion trap to make the UV light be irradiated into the ion trap interior; the gas-phase sample to be tested can be introduced into ion trap interior; the UV light can be used for irradiating gas-phase sample to be tested so as to implement ionization of the gas-phase sample to be test.

Description

technical field [0001] The invention relates to the technical field of mass spectrometry, in particular to a mass spectrometry device and method for improving the relative sensitivity and detection limit of detection, in particular to a method for ionizing a sample to be tested by photoionization, and enriching required ions A mass spectrometry device and a method thereof, more specifically relate to a mass spectrometry device and a method for detecting trace pollutants in the air. Background technique [0002] The application of mass spectrometry technology is very extensive, involving many fields such as basic scientific research, national defense, aerospace and other industries and civil applications. As far as specific applications are concerned, according to the different samples to be analyzed, there are various corresponding mass spectrometry instruments, and the specific implementation methods and structures of each component are also different. [0003] The general...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N30/08G01N30/06G01N30/02
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