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Method for measuring atomic force microscope needle type radius using single wall carbon nano tube

A technology of single-walled carbon nanotubes and atomic force microscopy, applied in measuring devices, scanning probe technology, instruments, etc., can solve the problems of poor accuracy, complex measurement and calculation, etc.

Inactive Publication Date: 2005-08-03
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the standard samples currently used by these methods, such as: polystyrene microspheres, gold nanospheres, gold-plated substrates, substrates with regular patterns, etc., are too large in size compared with the needle tip, and can only be evaluated at a maximum of 30nm or more. The radius of the needle tip, and the measurement and calculation are more complicated, the accuracy is poor, and it is far from meeting the actual needs

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  • Method for measuring atomic force microscope needle type radius using single wall carbon nano tube
  • Method for measuring atomic force microscope needle type radius using single wall carbon nano tube
  • Method for measuring atomic force microscope needle type radius using single wall carbon nano tube

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specific Embodiment approach 1

[0005] Specific implementation mode one: the following combination figure 1 and figure 2 This embodiment will be specifically described. This embodiment is realized through the following steps: one, the single-walled carbon nanotubes 2 with a diameter of 1 to 5 nm are deposited on the surface of the mica sheet 3; two, the measurement width w and the measured width of the single-walled carbon nanotubes 2 are measured by an atomic force microscope The height h of the single-walled carbon nanotube 2, the needle tip used to measure the single-walled carbon nanotube on the atomic force microscope is the needle tip 1 to be tested, and the height h of the single-walled carbon nanotube 2 is the height of the single-walled carbon nanotube 2 on the cross section. The diameter is 2Rs; during measurement, the needle tip 1 to be tested is brought into contact with the single-walled carbon nanotube 2, and it is best to select a single-walled carbon nanotube 2 whose cross-sectional radius ...

specific Embodiment approach 2

[0007] Specific embodiment 2: The difference between this embodiment and specific embodiment 1 is that step 1 is realized through the following steps: 1. Weigh 0.002 g of single-walled carbon nanotubes and dissolve them in 10 ml of absolute ethanol to form a concentration of 2.0 ×10 -4 g / ml dilute solution; ② Treat the prepared dilute solution with an ultrasonic wave with a frequency of 60KHZ for 1 hour at 25°C to separate the single-walled carbon nanotubes in the solution; ③ Take three drops of the solution and add it dropwise to a new On the surface of the stripped mica sheet 3, adjust the distribution density of carbon nanotubes by controlling the amount of drop to make the distribution density within 5×5 μm 2 At least one carbon nanotube 2 exists within the range. This embodiment makes the online measurement of the needle tip to be tested more convenient.

specific Embodiment approach 3

[0008] Specific embodiment three: the difference between this embodiment and specific embodiment one is that it also includes the following steps: selecting a plurality of single-walled carbon nanotubes, measuring and calculating the corresponding single-walled carbon nanotubes to be tested respectively. The value of the tip radius, and then calculate the average value of these values ​​as the final radius value of the tip to be tested. In this way, accidental errors can be eliminated and the measured needle tip radius value can be more accurate. Table 1 is the tip radius calculated from W and h of different single-walled carbon nanotubes measured by an atomic force microscope (AFM) equipped with the same tip to be tested

[0009] Single-walled carbon nanotubes1 Single-walled carbon nanotubes2 Single-walled carbon nanotubes3

[0010] Width (W) 24.5nm 18.3nm 14.5nm

[0011] Height (h) 4.3nm 2.5nm 1.51nm

[0012] Tip radius (R T ) 17.4nm 16.7nm 17.3nm

[...

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Abstract

The present invention discloses method of measuring atomic force microscope needle tip radius with single-wall carbon nanotube. The measurement includes the following steps: depositing single-wall carbon nanotube of 1-5 nm diameter on the surface of mica chip; measuring with atomic force microscope with the needle tip to be measured the measurement width w and height h of single-wall carbon nanotube; and calculating the radius of the needle tip to be measured based on w and h. The present invention uses the single-wall carbon nanotube as standard measuring sample for measuring the radius of the needle tip of atomic force microscope, and has the advantages of simple and intuitive mathematics mold clear physical meaning, precise, efficient and real-time measurement, etc. and may be used in measuring needle tip radius over 1 nm.

Description

Technical field: [0001] The invention relates to a method for measuring the tip radius of an atomic force microscope. Background technique: [0002] Atomic force microscopy (AFM) is currently one of the best means to characterize surface nanostructures. From the perspective of imaging principles, the smaller the geometric size of the tip, the higher the measurement accuracy. At present, the main manufacturers of AFM needle tips: Nanosensors, Veeco, and NT-MD have reduced the tip radius of the needle tip from an average of 30nm in the 1990s to about 10nm at present, and the tip radius of the latest ultra-fine needle tip is only 2nm. But in any case, as long as the needle tip of AFM has a certain geometric size, AFM will produce the problem of needle tip effect in the process of characterizing the sample, that is, the height value of the measured sample is accurate, and the width value is enlarged. For the measurement of general micron-scale samples, the size amplified by the...

Claims

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Application Information

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IPC IPC(8): G01B21/10G01Q40/00
Inventor 王铀
Owner HARBIN INST OF TECH
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