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Method for automatically removing useless scattering of fluorescence spectrum

A fluorescence spectrum, useless technology, applied in the field of analytical chemistry, can solve the problems of subjective judgment of scattering, can only process sample data once, and cannot automatically identify the scattering position, etc., to increase universality, avoid subjectivity, and time-consuming short effect

Pending Publication Date: 2022-07-08
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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  • Application Information

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Problems solved by technology

However, most of the existing methods have corresponding deficiencies and areas to be improved. Often, the sample data can only be processed once, and at the same time, the scattering position cannot be automatically identified during the data processing process, and the scattering position can only be judged subjectively. question

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  • Method for automatically removing useless scattering of fluorescence spectrum
  • Method for automatically removing useless scattering of fluorescence spectrum
  • Method for automatically removing useless scattering of fluorescence spectrum

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Embodiment Construction

[0052] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0053] Three-dimensional fluorescence spectroscopy is a fluorescence analysis technology that has been widely used in recent years. It has a wide range of applications in the fields of food science, analytical chemistry, biochemistry and environmental science. The three-dimensional fluorescence spectrum is a matrix spectrum characterized by the three-dimensional coordinates of the excitation wavelength (Emission, Em), the emission wavelength (Excitation, Ex), and the fluorescence intensity (the fluorescence intensity value is represented by Z). Graph of the relationship between emission wavelength changes. Three-dimensional fluorescence spectroscopy can not only obtain excitation wavelength and emission wavelength, but also obtain fluorescence intensity information when changing.

[0054] At present, there are several methods to deal with the...

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Abstract

The invention belongs to the field of analytical chemistry, and particularly relates to a calculation method for automatically identifying a scattering area, removing scattering data and filling a removed part. Comprising the following steps: firstly, for two-dimensional spectral data, judging a scattering position through Raman scattering and Rayleigh scattering mechanisms and corresponding energy; then, on the basis of the one-dimensional spectral data, the coverage range of scattering energy is judged through the scattering position and the scattering intensity, and useless energy is removed; and finally, performing interpolation processing on the scattering data removed region to achieve the purposes of removing useless scattering and complementing. According to the method, the useless scattering position can be quickly and automatically identified, the width of scattering energy does not need to be manually set, and data is reserved to the maximum extent within an acceptable error range, so that the accuracy and the implementation efficiency in the scattering removal process are greatly improved. This makes it possible to realize batch processing of a large amount of scattering-containing spectral data.

Description

technical field [0001] The invention uses a numerical calculation method to remove useless scattering data in a three-dimensional fluorescence spectrum, belongs to the field of analytical chemistry, and particularly relates to a calculation method for automatically identifying scattering regions, removing scattering data and filling the removed parts. Background technique [0002] Fluorescence excitation emission matrix measurements have a wide range of applications in food science, analytical chemistry, biochemistry, and environmental science. However, due to the generation mechanism of the fluorescence spectrum, there are Rayleigh scattering and Raman scattering, which are often complicated to analyze and remove. There are several ways to deal with the effects of unwanted scattering at this stage. However, most of the existing methods have corresponding deficiencies and areas to be improved. There are often only one-time processing of sample data, and at the same time, in...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/64
CPCG01N21/6428
Inventor 翁俊贲李国辉李焱郭秋含牟晓红
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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