Bionic circuit and method for non-contact electrostatic potential distribution test
An electrostatic potential and non-contact technology, which is applied in the field of bionic circuits for non-contact electrostatic potential distribution testing, can solve the problems of improving the spatial resolution of the test method, not being able to improve the spatial resolution of the array density, and high input resistance. It is difficult to improve the test speed and spatial resolution at the same time, solve the effect of low spatial resolution and increase the array density
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0044] The present invention solves the test speed and spatial resolution of the non-contact electrostatic potential distribution test in combination with a multi-sensor parallel setting, solving the test speed and spatial resolution of the non-contact electrostatic potential distribution test.
[0045] The technical solutions of the present invention will be described below in conjunction with examples, as will be described herein, as described in the embodiments of the invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art are in the range of the present invention without making creative labor premise.
[0046]In the description of the present invention, it is necessary to understand that the term * # * center * # *, * # * portrait * # *, * # * horizontal * # *, * # * length * # *, * # * width * # *, * # * Thickness * # *, * # * on * # *, * # * *, * # * after * # *, * # * left * # * ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com