Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Manufacturing method and manufacturing equipment for semiconductor device

A manufacturing method and semiconductor technology, applied in semiconductor/solid-state device manufacturing, semiconductor devices, semiconductor/solid-state device components, etc., can solve the problems of device production efficiency decline, production cost increase, anti-packaging stress ability and heat dissipation ability. , to achieve the effects of improving efficiency, reducing manual operations, meeting chip protection and reliability

Active Publication Date: 2022-02-08
浙江里阳半导体有限公司
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As the TVS power is getting bigger and bigger, the chip size of the product will increase accordingly. At the same time, the chip area will increase, and the product’s ability to resist packaging stress and heat dissipation will become more and more difficult. At the same time, the increase in chip area and materials will also make the device The production efficiency decreases and the production cost increases

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Manufacturing method and manufacturing equipment for semiconductor device
  • Manufacturing method and manufacturing equipment for semiconductor device
  • Manufacturing method and manufacturing equipment for semiconductor device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The present invention will be further described in detail below through specific embodiments in conjunction with the accompanying drawings. Wherein, similar elements in different implementations adopt associated similar element numbers. In the following implementation manners, many details are described for better understanding of the present application. However, those skilled in the art can readily recognize that some of the features can be omitted in different situations, or can be replaced by other elements, materials, and methods. In some cases, some operations related to the application are not shown or described in the description, this is to avoid the core part of the application being overwhelmed by too many descriptions, and for those skilled in the art, it is necessary to describe these operations in detail Relevant operations are not necessary, and they can fully understand the relevant operations according to the description in the specification and genera...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Diameteraaaaaaaaaa
Thicknessaaaaaaaaaa
Login to View More

Abstract

Provided are a manufacturing method and manufacturing equipment for a semiconductor device. According to the manufacturing method, circular heat dissipation copper sheets are provided for heat dissipation, and the edge of each heat dissipation copper sheet is provided with a positioning hole group, so that when the upper surface and the lower surface of a chip are respectively covered with the heat dissipation copper sheets, and preset soldering lugs are arranged between the heat dissipation copper sheets and the upper and lower surfaces of the chip, the chip can be quickly limited at preset positions in the heat dissipation copper sheets by inserting positioning pins into the positioning hole groups, and therefore, manual operation is reduced, the efficiency is improved, and the production cost is reduced. Meanwhile, as the surface area of the heat dissipation copper sheets is larger than that of the chip, heat dissipation can be better achieved, meanwhile, the chip can be protected against collision, and the requirements for chip protection and reliability are met.

Description

technical field [0001] The invention relates to the field of semiconductor device manufacturing, in particular to a semiconductor device manufacturing method and manufacturing equipment thereof. Background technique [0002] TVS diodes are widely used in the protection of semiconductors and sensitive devices, usually for secondary protection, for secondary protection after gas discharge tubes, and can also be directly used for primary protection of circuits. [0003] As a basic circuit component, the market demand for diodes is very large. At the same time, with the development of the market, the application field of semiconductor products is developing in two directions. One is getting thinner and thinner, which requires circuit protection devices. The volume is getting smaller and smaller, and the devices are developing towards miniaturization; at the same time, in some fields, the function integration is getting higher and higher, and the power of the circuit is getting h...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/48H01L21/50H01L23/367H01L23/373
CPCH01L21/4882H01L23/3672H01L23/3736H01L24/84H01L24/77H01L2224/8409H01L2224/77
Inventor 李晓锋招景丰
Owner 浙江里阳半导体有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products