Selective testing device for semiconductor material research and development

Abstract

The invention provides a selective testing device for semiconductor device material research and development, relates to the technical field of semiconductor testing, and solves the problems that although the conductive state of a semiconductor material can be tested through contact between the semiconductor material and a testing circuit, the structure is too single and multiple cleaning of an indicating lamp and wiping cleaning of a contact chip cannot be automatically realized in a semiconductor conduction test process through structural improvement. The selective testing device for semiconductor device material research and development comprises a main body plate. The main body plate is fixed to the workbench, a mounting base is mounted on the main body plate, and a blank is placed on the mounting base. The number of clamping grooves is two, and the two clamping grooves are formed in the two supporting plates correspondingly. The two clamping grooves are each of a rectangular groove-shaped structure, the mounting base is jointly inserted into the two clamping grooves, and after the fixing bolt is screwed down, the mounting base is in a clamped and fixed state, so that the mounting base does not need to be fixed by independently using a bolt.

Description

technical field [0001] The invention belongs to the technical field of semiconductor testing, and more specifically relates to a selection testing device for research and development of semiconductor device materials. Background technique [0002] In the process of research and development of semiconductor materials, it is necessary to conduct electrical tests on multiple semiconductor materials to test their electrical conductivity. [0003] Such as the application number: CN201410606182.7, a semiconductor test fixture, including: a base; a number of test pins located on the base, each test pin includes a first test pin, the first test pin includes a first body, located on the second A first test terminal at one end of the body and a first connection terminal at the other end of the first body; an insulator covering the surface of the first body of the first test pin; a second test terminal on the surface of the insulator surrounding the first test pin The second test need...

AI Technical Summary

Problems solved by technology

[0007] In order to solve the above-mentioned technical problems, the present invention provides a selective testing device for the research and development of semiconductor device materials to solve the existing one. Although the existing device can realize the test of the conductive state of the semiconductor material through the contact between the semiconductor material and the test circuit, the structure It is too single, and it is impossible to automatically realize multiple cleaning of the indicator light and wipe cleaning of the contact piece through structural improvement in the process of realizing the semiconductor conductivity test; moreover, most of the contact pieces of the existing devices are fixed on the main body by bolts On the board, disassembly is not convenient enough, and it cannot be combined with the fixing of the main board through structural improvement; finally, the fixing bolts of the main board of the existing device are easy to loose, and the fixing cannot be realized through structural improvement The problem of elastic anti-loosening of bolts

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