Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Novel X-ray multi-mode imaging method based on grating interferometer

A multi-mode imaging and grating interference technology, applied in the field of X-ray imaging, can solve the problems of inability to accurately obtain dark field signals of absorption signals, restrict popularization and application, reduce the efficiency of X-ray multi-mode imaging experiments, etc., and achieve fast X-ray multi-mode Imaging, avoiding the effect of multiple exposures

Active Publication Date: 2021-11-05
HEFEI UNIV OF TECH
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the stepping position of the absorption analysis grating does not meet the expected equidistant requirements, the phase stepping method will fail, and the absorption signal, refraction signal, and dark field signal of the imaged object cannot be accurately obtained from the measured light intensity data.
This reduces the experimental efficiency of X-ray multi-mode imaging based on grating interferometer, and restricts the popularization and application of this multi-mode imaging method in clinical medical diagnosis and treatment, industrial non-destructive testing and other fields.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Novel X-ray multi-mode imaging method based on grating interferometer
  • Novel X-ray multi-mode imaging method based on grating interferometer
  • Novel X-ray multi-mode imaging method based on grating interferometer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0055] In this example, see figure 1 , setting an X-ray grating interferometer composed of an X-ray source 1, a phase grating 2, an absorption analysis grating 3 and a detector 4; as figure 1 As shown, the position of the X-ray source 1 is taken as the origin O of the coordinate system, the direction of the ray axis is the Z-axis, the direction of the grating structure perpendicular to the ray axis and parallel to the phase grating 2 is the Y-axis, and the vertical The direction of the ray axis and the grid line structure of the phase grating 2 is the X axis, and a rectangular coordinate system O-XYZ is established;

[0056] X-ray source 1, phase grating 2, absorption analysis grating 3, and detector 4 are arranged in sequence along the Z axis; and X-ray source 1, phase grating 2, absorption analysis grating 3, and detector 4 are arranged along the Y axis top center alignment;

[0057] An X-ray fast multi-mode imaging method is performed as follows:

[0058] Step 1. Set the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a novel X-ray multi-mode imaging method based on a grating interferometer, which is applied to an X-ray grating interferometer consisting of an X-ray source, a phase grating, an absorption analysis grating and a detector which are sequentially arranged along a Z-axis direction and aligned along the center of a Y-axis direction; X-rays emitted by the X-ray source enter the phase grating to be spatially modulated, and emergent X-rays penetrate through an imaged object, absorb the analysis grating and then enter the detector; intensity distribution of the spatially modulated X-rays is measured and recorded by a detector; light intensity distribution data recorded by the detector are processed by using a proposed signal calculation formula, and an absorption signal, a refraction signal and a dark field signal of an imaged object can be obtained. According to the method, a problem of quantitative and accurate extraction of the absorption signal, the refraction signal and the dark field signal of the imaged object when the stepping position of the absorption analysis grating does not meet the equidistant requirement can be solved.

Description

technical field [0001] The invention relates to the field of X-ray imaging, in particular to an X-ray multi-mode imaging method based on a grating interferometer. Background technique [0002] After nearly two decades of basic theoretical development and improvement and application exploration and research, the X-ray multi-mode imaging method based on grating interferometer has gradually developed into a powerful supplement to the existing X-ray imaging technology. According to the imaging principle, the absorption signal, refraction signal and dark field signal of the imaged object all contribute significantly to the light intensity distribution directly measured by the detector. Therefore, using a certain signal extraction formula, the absorption signal, refraction signal and dark field signal of the imaged object can be simultaneously obtained from a set of light intensity data measured by the detector. That is, X-ray grating interferometer imaging is a multi-mode imagin...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/041A61B6/00
CPCG01N23/041A61B6/4035A61B6/48
Inventor 王志立陈恒
Owner HEFEI UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products