Substrate management controller failure processing method and system, storage medium and single-chip microcomputer

A substrate management and processing method technology, applied in the field of substrate management controllers, can solve problems such as danger, server damage, sensor status and temperature parameters that cannot be detected and controlled, and achieve the effect of avoiding abnormal conditions

Pending Publication Date: 2021-11-02
SHANGHAI HI TECH CONTROL SYST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the baseboard management controller chip fails, various parameters such as sensor status and temperature cannot be detected and controlled, so that the normal operation of the server system cannot be guaranteed
When the temperature is too high, it may even damage the server and cause a dangerous situation

Method used

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  • Substrate management controller failure processing method and system, storage medium and single-chip microcomputer
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  • Substrate management controller failure processing method and system, storage medium and single-chip microcomputer

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Embodiment Construction

[0038] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that, in the case of no conflict, the following embodiments and features in the embodiments can be combined with each other.

[0039] It should be noted that the diagrams provided in the following embodiments are only schematically illustrating the basic ideas of the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the compo...

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Abstract

The invention provides a substrate management controller failure processing method and system, a storage medium and a single-chip microcomputer. The substrate management controller failure processing method comprises the following steps of collecting working state information of a first substrate management controller serving as a working substrate management controller; and when judging that the first substrate management controller fails according to the working state information, selecting a second substrate management controller as a working substrate management controller, refreshing the first substrate management controller again and restarting the first substrate management controller. According to the substrate management controller failure processing method and system, the storage medium and the single-chip microcomputer, rapid recovery after failure of the substrate management controller is realized through a dual backup mode of the substrate management controller.

Description

technical field [0001] The present invention relates to the technical field of Baseboard Management Controller (BMC), in particular to a method and system for processing failure of the Baseboard Management Controller, a storage medium and a single-chip microcomputer. Background technique [0002] The baseboard management controller can perform some operations on the server, such as firmware upgrade, viewing machine equipment, etc., when the server is not powered on, so as to realize functions such as local and remote diagnosis, console support, configuration management, hardware management, and troubleshooting. [0003] In the prior art, the baseboard management controller chip may fail to some extent during operation, resulting in the loss of the function of the baseboard management controller. When the baseboard management controller chip fails, various parameters such as the status and temperature of the sensor cannot be detected and controlled, so that the normal operati...

Claims

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Application Information

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IPC IPC(8): G06F9/4401
CPCG06F9/4401
Inventor 赵杰孟崴周义叶小令
Owner SHANGHAI HI TECH CONTROL SYST
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