Standard sample for analyzing trace elements of high-purity tungsten and preparation method of standard sample

Abstract

The invention relates to a standard sample for analyzing trace elements of high-purity tungsten and a preparation method of the standard sample, and belongs to the field of analysis and detection of high-purity metals. The standard sample comprises elements of Al, As, B, Ba, Bi, Ca, Cd, Cu, Cr, Co, Fe, Hf, K, Mg, Mn, Mo, Na, Ni, P, Pb, Sb, Si, Sn, Sr, Ta, Ti, Zn and Zr, the content of each element is 0.1 ppm to 500 ppm, and the balance is W. The method comprises following steps of: putting the raw materials into an evaporation stirrer to obtain crude ammonium tungstate crystals; performing hydrogenation reduction to obtain tungsten powder; performing mechanical stirring, performing ball-milling crushing, and performing mechanical stirring and mixing again; detecting the content of impurity elements; briquetting and sintering the material; and performing component uniformity inspection and valuing on the chemical standard sample. The high-purity tungsten standard sample obtained by the method disclosed by the invention is regular in shape, uniform in component, good in stability and accurate in fixed value, and can be used for correcting a high-purity tungsten trace element measurement result and monitoring an instrument and equipment state.

Description

technical field [0001] The invention relates to a high-purity tungsten standard sample and a preparation method thereof, in particular to a high-purity tungsten trace element analysis standard sample and a preparation method thereof, belonging to the field of high-purity metal analysis and detection. Background technique [0002] With the development and progress of modern high technology, the demand for key basic materials such as ultra-high-purity rare / precious metals is increasing day by day in the fields of aviation, aerospace, integrated circuits, and high-performance semiconductor lighting. The demand of researchers for the ability to detect trace impurity elements in ultra-high-purity metals is also gradually increasing. To improve the detection ability, the research and development of supporting standard samples is essential. At present, the standard sample of high-purity tungsten can be found to be BAM S002 developed in Germany, with 15 fixed value elements and the...

AI Technical Summary

Problems solved by technology

[0003] Aiming at the problems that the existing high-purity tungsten standard samples are expensive and cover few types of elements, the present invention has developed a new single-point standard sample for high-purity W component analysis, which can significantly reduce costs and greatly increase coverage The type of element

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