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Conductive material broadband passive intermodulation characterization method based on elliptical monopole patch antenna

A technology of patch antenna and conductive material, applied in antenna radiation pattern, electromagnetic field characteristics, measurement of electrical variables, etc., can solve the problem of lack of direct and effective comparison methods for intermodulation performance, and achieve low test cost, short test period, and high reliability. high control effect

Active Publication Date: 2021-10-15
XI AN JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, for the RF front-end, when comparing the PIM levels of conductive fabrics with different components, the whole machine can only be tested and compared after being assembled.
At the same time, there is also a lack of direct and effective comparison methods for the intermodulation performance between conductive materials such as conductive cloth, foam, and silver paste.

Method used

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  • Conductive material broadband passive intermodulation characterization method based on elliptical monopole patch antenna
  • Conductive material broadband passive intermodulation characterization method based on elliptical monopole patch antenna
  • Conductive material broadband passive intermodulation characterization method based on elliptical monopole patch antenna

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Embodiment Construction

[0033] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art. It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0034] figure 1 Given is the antenna reflection PIM test framework, in which the carrier is transmitted to the antenna through the power amplifier, combiner ...

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Abstract

The invention relates to a conductive material broadband passive intermodulation characterization method based on an elliptical monopole patch antenna, which comprises the following steps: 1) conducting calibration, specifically connecting a calibration copper foil patch to an antenna feeder through soldering tin, testing antenna electrical parameters and reflection PIM, and ensuring a loop connection state and a low intermodulation characteristic; 2) replacing a material to be tested, specifically cleaning a connecting material between the antenna feeder and the copper foil patch, taking down the calibration copper foil, and assembling the material to be tested after cleaning; 3) representing the intermodulation characteristic of the MUT; 4) testing all the to-be-tested materials; 5) conducting inspection, specifically observing whether more than two types of reflection PIM of the MUT fall below the sensitivity of a receiving system, if so, increasing the input power by a step length of 1dB until the PIM amplitude of the MUT falls in the test threshold of the PIM test system; and 6) conducting normalization, specifically according to the test result in the step 3), normalizing the test results of all MUTs according to a formula of PIM test result + (43-test input power) * 2.5, and approximately obtaining PIM test results of all DUTs under 43dBm dual-carrier excitation.

Description

technical field [0001] The invention belongs to the technical field of radio frequency passive intermodulation testing, and in particular relates to a broadband passive intermodulation characterization method of conductive materials based on an elliptical monopole patch antenna. Background technique [0002] Due to the potential risk of material nonlinearity and contact nonlinearity in RF devices, multiple carrier signals passing through the device will excite some interference signals in the loop, and the third-order intermodulation signal will seriously deteriorate the signal-to-noise ratio of the system. Most of the PIM test platforms caused by contact nonlinearity are based on the conductive PIM test method, and the corresponding contact state is measured by comparing the PIM level under different contact interfaces and contact pressures. During the measurement, the contact pressure is achieved with a torque wrench or a mechanical arm loaded with a force sensor. Compare...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/10G01R29/08
CPCG01R29/10G01R29/0871
Inventor 贺永宁张可越周昊楠
Owner XI AN JIAOTONG UNIV
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