Intelligent probe card based on 32-bit MCU chip test

Abstract

The invention discloses an intelligent probe card based on 32-bit MCU chip testing. A miniature electromagnet is fixedly arranged at the middle end in a substrate from top to bottom, a relay is fixedly arranged on the lower side of the front end of the substrate, visual detectors are fixedly arranged on the left and right sides of the front end of the substrate, probes are arranged on the left and right sides in the substrate from top to bottom in a sliding manner, The baffle is fixedly arranged on the outer wall of the probe, the spring is fixedly arranged on the side wall of the baffle, the insulation sleeve is fixedly arranged on an inner side port of the probe, the iron core is fixedly arranged in the insulation sleeve, firstly, the probe can conduct signal detection on a chip, and secondly, the visual detector can scan the model of the chip needing to be detected; and finally, the micro electromagnet and the relay are controlled according to the detection result, so that the iron core drives the insulation sleeve to link the probe and the baffle plate to overcome the rebound resilience of the spring to slide, the probe at the corresponding position can be matched according to the model of the to-be-detected chip, the test of multiple models of chips can be met, and the purpose of intelligent regulation and control can be achieved at the same time.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to an intelligent probe card based on 32-bit MCU chip testing. Background technique [0002] In the manufacturing process of integrated circuits (ICs), probe cards are used to test integrated circuits on wafers before the integrated circuits are packaged. Generally, the probe card is electrically connected to a tester and a device under test (DUT) including integrated circuits. Through the probe card, each pin (pad) on the integrated circuit is stably connected to the testing machine to screen out defective products and measure the yield of the integrated circuit before packaging. Since the probe card is a key tool for monitoring the yield rate of finished products, it is extremely important in the process of IC design and manufacturing. [0003] According to the above, the probe cards in the current prior art generally have a simple structure, and a probe card of a structura...

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Problems solved by technology

[0003] According to the above, the current probe cards in the prior art generally have a simple structure, and a probe card of a structural type can only detect corresponding chips. Therefore, when multiple types of chips need to be detected, a new structure probe must be developed. Needle card, which not only increases the cost of testing, but also greatly prolongs the time of chip production and manufacturing

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