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CT flat panel detector and CT machine

A technology of flat-panel detectors and operational amplifiers, which is applied in the direction of electric solid-state devices, semiconductor devices, and instruments for radiological diagnosis, etc., to achieve the effects of increasing the number of longitudinal scanning layers, good economic benefits, and reducing patient radiation

Pending Publication Date: 2021-09-24
刘洪斌
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] The technical problem to be solved by the present invention is to provide a CT flat panel detector and a CT machine to overcome the defects of existing CT machines and solve the technical problems of applying existing flat panel detectors to CT machines

Method used

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  • CT flat panel detector and CT machine
  • CT flat panel detector and CT machine
  • CT flat panel detector and CT machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0086] Such as Figure 4 and Figure 5 As shown, in this embodiment, the CT flat panel detector uses the junction capacitance of the photodiode itself to store and collect data, and the reading signal is added to the inside of the array element; each array element includes not only one photodiode, but also one reading Use TFT, 1 TFT for amplification and 1 TFT for reset; TFT for reading is used to control the output of data, and its control signal is called the reading signal (marked as V in each figure READ ); the reset TFT is used to reset the data, and its control signal is called a reset signal (marked as V in each figure GRST ), whose power supply is called the reset power supply (marked as V in each figure RST ); the TFT for reading is set after the TFT for amplification; in this embodiment, the post-stage operational amplifier adopts an inverting amplifier or a non-inverting amplifier. The circuit diagram of the single acquisition unit of the CT flat panel detector i...

Embodiment 2

[0101] In this embodiment, the CT flat panel detector in Embodiment 1 is adopted, and the circuit diagram of each acquisition unit is as follows Figure 4 As shown, the corresponding pixel matrix circuit structure diagram is shown in Figure 5 shown. Here, the description of its structure will not be repeated.

[0102] The application condition of the CT flat panel detector in this embodiment is a CT machine adopting the working mode of the existing ray emitter: when the CT flat panel detector collects and reads, the ray emitter emits rays continuously.

[0103]Timing control in this embodiment: Since the ray emitter is still continuously emitting rays during reading, and the photodiode is constantly collecting data, for the sake of image quality, the reading time is required to be as short as possible (required reading time≤reading period 10%, the smaller the better, but the smaller the requirement for the mobility of the thin film transistor of the detector, the higher the...

Embodiment 3

[0111] like Image 6 and Figure 7 As shown, in this embodiment, the junction capacitance of the photodiode itself is used to store and collect data; each array element in the pixel matrix includes not only a photodiode, but also a reset TFT for resetting the data , its control signal is called the reset signal, and its power source is called the reset power supply, and all array elements share the same reset power supply; the reading signal of the CT flat panel detector is input into the array element to amplify the TFT, so that the amplification is performed by the TFT Control the output of data while amplifying the process. In this embodiment, the post-stage operational amplifier is an inverting amplifier or a non-inverting amplifier.

[0112] In the CT machine of this embodiment, the ray emitter adopts the ray pulse control method in Embodiment 1, and its working principle will not be described again here.

[0113] Sequence control in this embodiment: the reading time n...

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Abstract

The present invention provides a CT flat panel detector. Each array element is provided with an independent post-stage operational amplifier and an analog-to-digital converter, and each array element scans at the same time by taking a row as a unit to obtain a projection matrix of a tangent plane where each row is located. The invention further provides the CT machine. By enlarging the size of the flat panel detector, the CT machine can obtain the requirement of each section image of one part by scanning a circle or a half circle, and spiral scanning is not needed any more; the internal circuit of the acquisition unit is improved, so that the circuit structure meets the requirements of CT scanning, and better image quality under respective conditions is obtained; the substrate adopts a double-sided technology, so that the signal-to-noise ratio is improved; the scanning frequency is reduced by reducing the number of array elements in each row; and through a ray pulse control technology of a CT machine, or through removing a TFT for reading in an array element and transferring the function to a peripheral circuit, the requirement of the CT machine on the mobility of a thin film transistor of the detector is reduced, so that the CT flat panel detector can be practically applied.

Description

technical field [0001] The invention relates to the technical field of CT equipment, in particular to a CT flat panel detector and a CT machine. Background technique [0002] Existing CT machines use detectors dedicated to CT with huge structures, mostly made of rare earth ceramics and in an arc shape. Analog-to-digital conversion circuit), the number of rows has developed from the initial single row to the current mainstream 128 rows (individually 256 rows or 320 rows), and the number of effective detection elements in each row is less than 900. [0003] Existing CT machine detector and its CT machine have the following objective shortcomings: [0004] 1. The number of detector rows is limited, so that the scanning range of 360°rotational scanning is relatively narrow (now the widest vertical detector is 160mm, which can basically meet the single-turn scanning requirements of small parts, but still cannot meet the single-turn scanning requirements of large parts. Circle s...

Claims

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Application Information

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IPC IPC(8): H01L27/146A61B6/00A61B6/03
CPCH01L27/14663H01L27/14609H01L27/14612A61B6/032A61B6/4208A61B6/4233
Inventor 刘洪斌
Owner 刘洪斌
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