Rapid measurement device and method for spurious suppression of communication comprehensive test equipment

Abstract

The invention discloses a rapid measurement device and method for spurious suppression of communication comprehensive test equipment, and belongs to the technical field of testing. The rapid measurement method for spurious suppression of the communication comprehensive test equipment provided by the invention has a function of selecting two measurement modes of measurement speed priority and measurement quality priority, and a more flexible measurement method is provided for different test scenes; secondly, the measurement process is dynamically adjusted and automatically memorized, the optimal test parameters of the current measurement equipment can be obtained and stored in a local database for direct use next time, the automation degree is higher, and the measurement efficiency is higher.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a rapid measurement device and method for spurious suppression of comprehensive communication testing equipment. Background technique [0002] Communication comprehensive test equipment is a kind of comprehensive measuring instrument used in radio communication measurement fields such as radio stations in the field of testing. It can test various performance indicators of radio stations. The spurious suppression ratio is an important measurement index of communication receivers. Dispersion suppression measurement is an important measurement function of communication comprehensive test equipment, but the measurement speed of this function is often slow and the control process is complicated. The shortcomings of the unimproved measurement process are particularly obvious when measuring wide-band and high-density frequency points. [0003] Since the market demand for com...

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Problems solved by technology

[0006](1) The measurement method is single, the flexibility and measurement efficiency are not high, and the measurement time is very long when the scanning frequency band is wide and the step is small, and the problem is particularly obvious;

[0007](2) The measurement process is fixed and cannot adapt to various measurement environments, and cannot dynamically optimize the measurement parameters or process according to the actual measurement results;

[0008](3) Cannot automatically remember the last optimized process parameters, cannot automatically load the optimal measurement scheme, poor operating experience

[0010](1) Aiming at the problem of single measurement method and long measurement time, it provides a measurement method that can be selected according to the priority of measurement speed and quality, and can be used according to the test site equipment According to the characteristics and needs of testers, choose the optimal measurement plan;

[0011](2) Aiming at the problem of fixed measurement process and low measurement efficiency, it provides a method that can automatically optimize the measurement process according to the stability of each measurement result of the instrument during the measurement process method, which can increase the measurement speed to a greater extent after the tester selects the speed priority mode;

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