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Method and system for measuring plasma parameters of femtosecond laser-induced gas ionization

A kind of plasma and femtosecond laser technology, applied in the direction of plasma, greenhouse gas reduction, general control system, etc., can solve the problem of not being able to accurately obtain the dynamic evolution of plasma parameters, so as to save measurement time, reduce measurement errors, and improve The effect of parameter acquisition speed

Active Publication Date: 2022-05-20
HUAZHONG UNIV OF SCI & TECH
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Aiming at the above defects or improvement needs of the prior art, the present invention provides a method and system for measuring plasma parameters of femtosecond laser-induced gas ionization to solve the problem that the prior art cannot simply, quickly and accurately obtain femtosecond laser-induced gas ionization Technical issues of the dynamic evolution of the resulting plasma parameters

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  • Method and system for measuring plasma parameters of femtosecond laser-induced gas ionization

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Embodiment 1

[0040] A method for measuring plasma parameters of femtosecond laser-induced gas ionization, such as figure 1 shown, including the following steps:

[0041] S1. Use the picosecond laser as the probe light to detect the dynamic evolution process of the plasma obtained by femtosecond laser-induced gas ionization, and obtain the diffraction spectrum I of the plasma meas (ω,r); where, ω is the frequency scale of the diffraction spectrum, corresponding to the horizontal axis in the diffraction spectrum image; r is the spatial scale of the diffraction spectrum, corresponding to the vertical axis in the diffraction spectrum image; the picosecond laser is a linear chirped pulse ;

[0042] It should be noted that the present invention is applicable to plasmas obtained by femtosecond laser-induced ionization of gases such as air, helium, oxygen, and mixed gases; the above-mentioned gases include not only single gases such as air, helium, and oxygen, but also mixed gases.

[0043] Spec...

Embodiment 2

[0078] A system for measuring plasma parameters of femtosecond laser-induced gas ionization, comprising:

[0079] The diffraction spectrum acquisition module is used to detect the dynamic evolution process of the plasma obtained by the femtosecond laser-induced gas ionization by using the picosecond laser as the probe light, and obtain the diffraction spectrum I of the plasma meas (ω,r); where, ω is the frequency scale of the diffraction spectrum, r is the spatial scale of the diffraction spectrum; the picosecond laser is a linear chirped pulse;

[0080] Diffraction model building blocks for building diffraction models based on Fraunhofer and Fresnel diffraction theories To characterize the plasma radius r p , detecting light phase shift The physical mapping relationship between the frequency scale ω and the spatial scale r of the diffraction spectrum;

[0081] Plasma Radius Calculation Module, for use from Diffraction Spectrum I meas Randomly select a frequency scale ω ...

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Abstract

The invention discloses a method and system for measuring plasma parameters of femtosecond laser-induced gas ionization. The picosecond laser is used as detection light to detect the dynamic evolution process of the plasma obtained by femtosecond laser-induced gas ionization, and based on the Diffraction model was established by Langhofer diffraction and Fresnel diffraction theory; the detected diffraction spectrum was fitted with the diffraction spectrum based on the diffraction model to obtain the frequency domain evolution of the phase shift of the detection light, and then the time domain evolution of the plasma parameters The present invention can acquire the spatiotemporal evolution process of the plasma in a single shot measurement, and does not need to adjust the delay line in the device to repeat the measurement, which greatly simplifies the operation process, saves the measurement time, reduces the measurement error, and improves the detection accuracy; and, the present invention only needs a single fitting of the diffraction spectrum to calculate and obtain the time domain evolution of plasma parameters, without the need for multiple extraction and fitting, which greatly improves the speed of parameter acquisition.

Description

technical field [0001] The invention belongs to the field of plasma parameter measurement, and more specifically relates to a method and system for measuring plasma parameters of femtosecond laser-induced gas ionization. Background technique [0002] Studying femtosecond laser-induced plasma is an important prerequisite for studying the mechanism of laser-matter interaction. After the femtosecond laser pulse is focused in the gas (such as air), the gas molecules absorb photons in an ultra-short time, and then ionize in the form of multi-photon ionization and avalanche ionization, forming a large number of free electrons, ions, and molecules in the focal area. composed of hot plasma clusters. Thanks to the extreme physical conditions (such as ultra-high temperature, pressure, and electron density) of the plasma cluster, femtosecond laser-induced gas ionization has been widely used in the fields of laser lightning, laser ignition, remote sensing, and high-speed laser switchin...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B13/04H05H1/00
CPCG05B13/042H05H1/0006Y02E30/10
Inventor 江浩张林刘佳敏刘世元
Owner HUAZHONG UNIV OF SCI & TECH
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