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Method and system for measuring plasma parameters of femtosecond laser induced gas ionization

A plasma and femtosecond laser technology, applied in the fields of plasma, greenhouse gas reduction, general control system, etc., can solve the problem of inability to accurately obtain the dynamic evolution of plasma parameters, save measurement time, reduce measurement errors, improve The effect of parameter acquisition speed

Active Publication Date: 2021-09-03
HUAZHONG UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] Aiming at the above defects or improvement needs of the prior art, the present invention provides a method and system for measuring plasma parameters of femtosecond laser-induced gas ionization to solve the problem that the prior art cannot simply, quickly and accurately obtain femtosecond laser-induced gas ionization Technical issues of the dynamic evolution of the resulting plasma parameters

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  • Method and system for measuring plasma parameters of femtosecond laser induced gas ionization
  • Method and system for measuring plasma parameters of femtosecond laser induced gas ionization
  • Method and system for measuring plasma parameters of femtosecond laser induced gas ionization

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Embodiment 1

[0040] A method for measuring plasma parameters of femtosecond laser-induced gas ionization, such as figure 1 shown, including the following steps:

[0041] S1. Use the picosecond laser as the probe light to detect the dynamic evolution process of the plasma obtained by femtosecond laser-induced gas ionization, and obtain the diffraction spectrum I of the plasma meas (ω,r); where, ω is the frequency scale of the diffraction spectrum, corresponding to the horizontal axis in the diffraction spectrum image; r is the spatial scale of the diffraction spectrum, corresponding to the vertical axis in the diffraction spectrum image; the picosecond laser is a linear chirped pulse ;

[0042] It should be noted that the present invention is applicable to plasmas obtained by femtosecond laser-induced ionization of gases such as air, helium, oxygen, and mixed gases; the above-mentioned gases include not only single gases such as air, helium, and oxygen, but also mixed gases.

[0043] Spec...

Embodiment 2

[0078] A system for measuring plasma parameters of femtosecond laser-induced gas ionization, comprising:

[0079] The diffraction spectrum acquisition module is used to detect the dynamic evolution process of the plasma obtained by the femtosecond laser-induced gas ionization by using the picosecond laser as the probe light, and obtain the diffraction spectrum I of the plasma meas (ω,r); where, ω is the frequency scale of the diffraction spectrum, r is the spatial scale of the diffraction spectrum; the picosecond laser is a linear chirped pulse;

[0080] Diffraction model building blocks for building diffraction models based on Fraunhofer and Fresnel diffraction theories To characterize the plasma radius r p , detecting light phase shift The physical mapping relationship between the frequency scale ω and the spatial scale r of the diffraction spectrum;

[0081] Plasma Radius Calculation Module, for use from Diffraction Spectrum I meas Randomly select a frequency scale ω ...

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Abstract

The invention discloses a method and a system for measuring plasma parameters of femtosecond laser-induced gas ionization, picosecond laser is used as detection light to detect the dynamic evolution process of plasma obtained by femtosecond laser-induced gas ionization, and a diffraction model is established based on Fraunhofer diffraction and Fresnel diffraction theories; the detected diffraction spectrum is fit with a diffraction spectrum obtained based on a diffraction model to obtain detection light phase shift frequency domain evolution and further obtain time domain evolution of plasma parameters; according to the invention, the space-time evolution process of the plasma can be obtained in single shot measurement, and a delay line in the device does not need to be adjusted for repeated measurement in the measurement process, so that the operation process is greatly simplified, the measurement time is saved, the measurement error is reduced, and the detection accuracy is improved; and moreover, the time domain evolution of the plasma parameters can be calculated and obtained only by fitting the diffraction spectrum for one time, multiple times of extraction and fitting are not needed, and the parameter obtaining speed is improved to a great extent.

Description

technical field [0001] The invention belongs to the field of plasma parameter measurement, and more specifically relates to a method and system for measuring plasma parameters of femtosecond laser-induced gas ionization. Background technique [0002] Studying femtosecond laser-induced plasma is an important prerequisite for studying the mechanism of laser-matter interaction. After the femtosecond laser pulse is focused in the gas (such as air), the gas molecules absorb photons in an ultra-short time, and then ionize in the form of multi-photon ionization and avalanche ionization, forming a large number of free electrons, ions, and molecules in the focal area. composed of hot plasma clusters. Thanks to the extreme physical conditions (such as ultra-high temperature, pressure, and electron density) of the plasma cluster, femtosecond laser-induced gas ionization has been widely used in the fields of laser lightning, laser ignition, remote sensing, and high-speed laser switchin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B13/04H05H1/00
CPCG05B13/042H05H1/0006Y02E30/10
Inventor 江浩张林刘佳敏刘世元
Owner HUAZHONG UNIV OF SCI & TECH
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